Intelligent Control for the next generation of fast scanning atomic force microscopes. Schitter, G., Menold, P., Knapp, H., Stemmer, A., & Allgöwer, F. 8th Workshop on Scanning-probe Microscopy and Organic Materials, Basel, 1999.
bibtex   
@MISC{ist:menold99c,
  author = {Schitter, G. and Menold, P.H. and Knapp, H. and Stemmer, A. and Allg{\"o}wer,
	F.},
  title = {Intelligent Control for the next generation of fast scanning atomic
	force microscopes},
  howpublished = {8th Workshop on Scanning-probe Microscopy and Organic Materials,
	Basel},
  year = {1999},
  pubtype = {misc}
}

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