Intelligent Control for the next generation of fast scanning atomic force microscopes. Schitter, G., Menold, P., Knapp, H., Stemmer, A., & Allgöwer, F. 8th Workshop on Scanning-probe Microscopy and Organic Materials, Basel, 1999. bibtex @MISC{ist:menold99c,
author = {Schitter, G. and Menold, P.H. and Knapp, H. and Stemmer, A. and Allg{\"o}wer,
F.},
title = {Intelligent Control for the next generation of fast scanning atomic
force microscopes},
howpublished = {8th Workshop on Scanning-probe Microscopy and Organic Materials,
Basel},
year = {1999},
pubtype = {misc}
}
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