Robust 2DOF-control of a piezoelectric tube scanner for high speed atomic force microscopy. Schitter, G., Stemmer, A., & Allgöwer, F. In Proc.\ American Control Conf.\ (ACC), pages 3720-3725, Denver, CO, USA, 2003. bibtex @INPROCEEDINGS{ist:schitter03a,
author = {Schitter, G. and Stemmer, A. and Allg{\"o}wer, F.},
title = {Robust {2DOF}-control of a piezoelectric tube scanner for high speed
atomic force microscopy},
booktitle = {Proc.\ American Control Conf.\ (ACC)},
year = {2003},
pages = {3720-3725},
address = {Denver, CO, USA},
pubtype = {proceeding}
}
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