Robust two-degree-of-freedom control of an atomic force microscope. Schitter, G., Stemmer, A., & Allgöwer, F. Asian J.\ Control, 6(2):156-163, 2004.
bibtex   
@ARTICLE{ist:schitter04b,
  author = {Schitter, G. and Stemmer, A. and Allg{\"o}wer, F.},
  title = {Robust two-degree-of-freedom control of an atomic force microscope},
  journal = {Asian J.\ Control},
  year = {2004},
  volume = {6},
  pages = {156-163},
  number = {2},
  pubtype = {journal}
}

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