A built-in self-testing framework for asynchronous bundled-data NoC switches resilient to delay variations. Miorandi, G., Celin, A., Favalli, M., & Bertozzi, D. In Tenth IEEE/ACM International Symposium on Networks-on-Chip, NOCS 2016, Nara, Japan, August 31 - September 2, 2016, pages 1–8, 2016.
A built-in self-testing framework for asynchronous bundled-data NoC switches resilient to delay variations [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/nocs/MiorandiCFB16,
  author    = {Gabriele Miorandi and
               Alberto Celin and
               Michele Favalli and
               Davide Bertozzi},
  title     = {A built-in self-testing framework for asynchronous bundled-data NoC
               switches resilient to delay variations},
  booktitle = {Tenth {IEEE/ACM} International Symposium on Networks-on-Chip, {NOCS}
               2016, Nara, Japan, August 31 - September 2, 2016},
  pages     = {1--8},
  year      = {2016},
  crossref  = {DBLP:conf/nocs/2016},
  url       = {http://dx.doi.org/10.1109/NOCS.2016.7579332},
  doi       = {10.1109/NOCS.2016.7579332},
  timestamp = {Thu, 06 Oct 2016 12:26:58 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/nocs/MiorandiCFB16},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
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