Numerical approach to predict power device reliability. Sitta, A., Russo, S., Bazzano, G., Cavallaro, D., Greco, G., & Calabretta, M. In 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2018, Taormina, Italy, April 9-12, 2018, pages 1–5, 2018. IEEE.
Numerical approach to predict power device reliability [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/dtis/SittaRBC0C18,
  author    = {Alessandro Sitta and
               Sebastiano Russo and
               Gaetano Bazzano and
               Daniela Cavallaro and
               Giuseppe Greco and
               Michele Calabretta},
  title     = {Numerical approach to predict power device reliability},
  booktitle = {13th International Conference on Design {\&} Technology of Integrated
               Systems In Nanoscale Era, {DTIS} 2018, Taormina, Italy, April 9-12,
               2018},
  pages     = {1--5},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://doi.org/10.1109/DTIS.2018.8368577},
  doi       = {10.1109/DTIS.2018.8368577},
  timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/dtis/SittaRBC0C18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

Downloads: 0