A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories. Zambelli, C., Indaco, M., Fabiano, M., Carlo, S. D., Prinetto, P., Olivo, P., & Bertozzi, D. In 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012, pages 881–886, 2012.
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/date/ZambelliIFCPOB12,
  author    = {Cristian Zambelli and
               Marco Indaco and
               Michele Fabiano and
               Stefano Di Carlo and
               Paolo Prinetto and
               Piero Olivo and
               Davide Bertozzi},
  title     = {A cross-layer approach for new reliability-performance trade-offs
               in {MLC} {NAND} flash memories},
  booktitle = {2012 Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2012, Dresden, Germany, March 12-16, 2012},
  pages     = {881--886},
  year      = {2012},
  crossref  = {DBLP:conf/date/2012},
  url       = {http://dx.doi.org/10.1109/DATE.2012.6176622},
  doi       = {10.1109/DATE.2012.6176622},
  timestamp = {Wed, 11 Nov 2015 00:00:00 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/date/ZambelliIFCPOB12},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}

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