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\n\n \n \n \n \n \n \n In-Situ QCM Impedance Analysis of Nanostructured Thin Film Growth.\n \n \n \n \n\n\n \n Hruška, M.; Kejzlar, J.; Otta, J.; Fitl, P.; Novotný, M.; Kiba, T.; Kawamura, M.; and Vrňata, M.\n\n\n \n\n\n\n
ISSP2024, The 17th International Symposium on Sputtering & Plasma Processes. 7 2024.\n
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@article{\n title = {In-Situ QCM Impedance Analysis of Nanostructured Thin Film Growth},\n type = {article},\n year = {2024},\n month = {7},\n id = {830ed1ab-8ad9-36aa-af1e-88203fa1d944},\n created = {2024-07-04T00:54:05.149Z},\n file_attached = {true},\n profile_id = {d93fd8e4-0fb0-3e3d-a377-1ecd109e9ef5},\n group_id = {79dcc08f-a69a-38df-be65-84478e4db9b9},\n last_modified = {2024-07-04T07:53:54.765Z},\n read = {false},\n starred = {false},\n authored = {false},\n confirmed = {false},\n hidden = {false},\n private_publication = {false},\n abstract = {A comprehensive understanding of thin film growth is pivotal for enhancing the performance of thin film sensors, especially those composed of highly nanostructured materials where uniformity in density across the film thickness is often lacking. Investigating the growth of these films, particularly through in-situ methods during deposition processes such as thermal evaporation or magnetron sputtering, is thus of great benefit. In this study, we explore the growth mechanisms of highly nanostructured black metals (BMs), particularly black gold (BAu) and black aluminum (BAl) prepared by thermal evaporation and magnetron sputtering using an in-situ Quartz Crystal Microbalance with Impedance Analysis (QCM-IA). By employing an advanced Butterworth-Van Dyke (BVD) fitting algorithm [1] for real-time measurements, we provide new insights into the complex processes that control thin film formation as well as their interactions with surrounding gaseous environment, by loading the vacuum apparatus with inert gases (He, N2, Ar), providing insights into subsequent sensor applications. Prepared films were characterized by SEM and AFM, confirming their nanostructured morphology. Additionally, these films were tested for their potential use as active layers for QCM sensors, showcasing their applicability in sensor technology. This approach not only provides a deeper understanding of the nanostructured film growth process but also emphasizes the integration of advanced characterization techniques for the enhancement of sensor functionalities. Building upon our previous studies of black metals [2, 3], this work extends our knowledge on nanostructured film growth and possibly also introduces methodology for in-depth investigations.\n[1]\tMartin Hruska (2024). QCM_BvD_Fitting_Toolbox, MATLAB Central File Exchange. Retrieved February 29, 2024. (https://www.mathworks.com/matlabcentral/fileexchange/136079-qcm_bvd_fitting_toolbox)\n[2]\tHruška, M., More-Chevalier, J., Fitl, P., Novotný, M., Hruška, P., Prokop, D., Pokorný, P., Kejzlar, J., Gadenne, V., Patrone, L., Vrňata, M., Lančok, J., Nanomaterials MDPI, 12 (23), (2023) 4297\n[3]\tHruška, M., Kejzlar, J., Otta, J., Fitl, P., Novotný, M., Čížek, J., Melikhova, O., Mičušík, M., Machata, P., Vrňata, M., Applied Surface Science, 647, (2024) 158618.},\n bibtype = {article},\n author = {Hruška, Martin and Kejzlar, Jan and Otta, Jaroslav and Fitl, Přemysl and Novotný, Michal and Kiba, Takayuki and Kawamura, Midori and Vrňata, Martin},\n journal = {ISSP2024, The 17th International Symposium on Sputtering & Plasma Processes}\n}
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\n A comprehensive understanding of thin film growth is pivotal for enhancing the performance of thin film sensors, especially those composed of highly nanostructured materials where uniformity in density across the film thickness is often lacking. Investigating the growth of these films, particularly through in-situ methods during deposition processes such as thermal evaporation or magnetron sputtering, is thus of great benefit. In this study, we explore the growth mechanisms of highly nanostructured black metals (BMs), particularly black gold (BAu) and black aluminum (BAl) prepared by thermal evaporation and magnetron sputtering using an in-situ Quartz Crystal Microbalance with Impedance Analysis (QCM-IA). By employing an advanced Butterworth-Van Dyke (BVD) fitting algorithm [1] for real-time measurements, we provide new insights into the complex processes that control thin film formation as well as their interactions with surrounding gaseous environment, by loading the vacuum apparatus with inert gases (He, N2, Ar), providing insights into subsequent sensor applications. Prepared films were characterized by SEM and AFM, confirming their nanostructured morphology. Additionally, these films were tested for their potential use as active layers for QCM sensors, showcasing their applicability in sensor technology. This approach not only provides a deeper understanding of the nanostructured film growth process but also emphasizes the integration of advanced characterization techniques for the enhancement of sensor functionalities. Building upon our previous studies of black metals [2, 3], this work extends our knowledge on nanostructured film growth and possibly also introduces methodology for in-depth investigations.\n[1]\tMartin Hruska (2024). QCM_BvD_Fitting_Toolbox, MATLAB Central File Exchange. Retrieved February 29, 2024. (https://www.mathworks.com/matlabcentral/fileexchange/136079-qcm_bvd_fitting_toolbox)\n[2]\tHruška, M., More-Chevalier, J., Fitl, P., Novotný, M., Hruška, P., Prokop, D., Pokorný, P., Kejzlar, J., Gadenne, V., Patrone, L., Vrňata, M., Lančok, J., Nanomaterials MDPI, 12 (23), (2023) 4297\n[3]\tHruška, M., Kejzlar, J., Otta, J., Fitl, P., Novotný, M., Čížek, J., Melikhova, O., Mičušík, M., Machata, P., Vrňata, M., Applied Surface Science, 647, (2024) 158618.\n
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