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\n  \n 2025\n \n \n (4)\n \n \n
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\n \n\n \n \n \n \n \n KAITIAN: A unified communication framework for enabling efficient collaboration across heterogeneous accelerators in embodied AI systems.\n \n \n \n\n\n \n Lin, J.; Wang, W.; Yin, L.; and Han, Y.\n\n\n \n\n\n\n arXiv preprint arXiv:2505.10183. 2025.\n \n\n\n\n
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@article{lin2025kaitian,\n  title={KAITIAN: A unified communication framework for enabling efficient collaboration across heterogeneous accelerators in embodied AI systems},\n  author={Lin, Jieke and Wang, Wanyu and Yin, Longxiang and Han, Yinhe},\n  journal={arXiv preprint arXiv:2505.10183},\n  year={2025}\n}\n\n
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\n \n\n \n \n \n \n \n Millisecond-Response Tracking and Gazing System for UAVs: A Domestic Solution Based on\" Phytium+ Cambricon\".\n \n \n \n\n\n \n Zhu, Y.; Yin, L.; and Zhao, K.\n\n\n \n\n\n\n arXiv preprint arXiv:2509.04043. 2025.\n \n\n\n\n
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@article{zhu2025millisecond,\n  title={Millisecond-Response Tracking and Gazing System for UAVs: A Domestic Solution Based on" Phytium+ Cambricon"},\n  author={Zhu, Yuchen and Yin, Longxiang and Zhao, Kai},\n  journal={arXiv preprint arXiv:2509.04043},\n  year={2025}\n}\n\n
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\n \n\n \n \n \n \n \n KAITIAN: Communication for Heterogeneous Accelerators in Embodied AI.\n \n \n \n\n\n \n Lin, J.; Wang, W.; Yin, L.; and Han, Y.\n\n\n \n\n\n\n In Proceedings of the 2025 Workshop on Architecture Support for Embodied AI Systems (Arch4EAI), volume 21, 2025. \n \n\n\n\n
\n\n\n\n \n\n \n\n \n link\n  \n \n\n bibtex\n \n\n \n\n \n\n \n \n \n \n \n \n \n\n  \n \n \n\n\n\n
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@inproceedings{lin2025kaitian,\n  title={KAITIAN: Communication for Heterogeneous Accelerators in Embodied AI},\n  author={Lin, Jieke and Wang, Wanyu and Yin, Longxiang and Han, Yinhe},\n  booktitle={Proceedings of the 2025 Workshop on Architecture Support for Embodied AI Systems (Arch4EAI)},\n  volume={21},\n  year={2025}\n}\n\n
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\n \n\n \n \n \n \n \n ODMA: On-Demand Memory Allocation Framework for LLM Serving on LPDDR-Class Accelerators.\n \n \n \n\n\n \n Zou, G.; Wang, W.; Zheng, H.; Yin, L.; and Han, Y.\n\n\n \n\n\n\n arXiv preprint arXiv:2512.09427. 2025.\n \n\n\n\n
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@article{zou2025odma,\n  title={ODMA: On-Demand Memory Allocation Framework for LLM Serving on LPDDR-Class Accelerators},\n  author={Zou, Guoqiang and Wang, Wanyu and Zheng, Hao and Yin, Longxiang and Han, Yinhe},\n  journal={arXiv preprint arXiv:2512.09427},\n  year={2025}\n}\n
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\n  \n 2021\n \n \n (1)\n \n \n
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\n \n\n \n \n \n \n \n Degradation analysis and optimization of temperature effect on MEMRISTOR-based Neural Network Accelerators by electro-thermal simulation.\n \n \n \n\n\n \n Shang, M.; Yin, L.; and Xu, N.\n\n\n \n\n\n\n In Journal of Physics: Conference Series, volume 1812, pages 012025, 2021. IOP Publishing\n \n\n\n\n
\n\n\n\n \n\n \n\n \n link\n  \n \n\n bibtex\n \n\n \n\n \n\n \n \n \n \n \n \n \n\n  \n \n \n\n\n\n
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@inproceedings{shang2021degradation,\n  title={Degradation analysis and optimization of temperature effect on MEMRISTOR-based Neural Network Accelerators by electro-thermal simulation},\n  author={Shang, Mengjun and Yin, Longxiang and Xu, Ning},\n  booktitle={Journal of Physics: Conference Series},\n  volume={1812},\n  number={1},\n  pages={012025},\n  year={2021},\n  organization={IOP Publishing}\n}\n\n
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\n  \n 2020\n \n \n (1)\n \n \n
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\n \n\n \n \n \n \n \n A Field Programmable Process-In-Memory Architecture Based on RRAM Technology.\n \n \n \n\n\n \n Liang, Y.; Yin, L.; and Xu, N.\n\n\n \n\n\n\n In 2020 5th International Conference on Mechanical, Control and Computer Engineering (ICMCCE), pages 2323–2326, 2020. IEEE\n \n\n\n\n
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@inproceedings{liang2020field,\n  title={A Field Programmable Process-In-Memory Architecture Based on RRAM Technology},\n  author={Liang, Yuan and Yin, Longxiang and Xu, Ning},\n  booktitle={2020 5th International Conference on Mechanical, Control and Computer Engineering (ICMCCE)},\n  pages={2323--2326},\n  year={2020},\n  organization={IEEE}\n}\n\n
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\n  \n 2019\n \n \n (1)\n \n \n
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\n \n\n \n \n \n \n \n Merging everything (ME) a unified FPGA architecture based on logic-in-memory techniques.\n \n \n \n\n\n \n Chen, X.; Yin, L.; Liu, B.; and Han, Y.\n\n\n \n\n\n\n In Proceedings of the 56th Annual Design Automation Conference 2019, pages 1–2, 2019. \n \n\n\n\n
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@inproceedings{chen2019merging,\n  title={Merging everything (ME) a unified FPGA architecture based on logic-in-memory techniques},\n  author={Chen, Xiaoming and Yin, Longxiang and Liu, Bosheng and Han, Yinhe},\n  booktitle={Proceedings of the 56th Annual Design Automation Conference 2019},\n  pages={1--2},\n  year={2019}\n}\n\n
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\n  \n 2018\n \n \n (5)\n \n \n
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\n \n\n \n \n \n \n \n Impact of ambient temperature on the self-heating effects in FinFETs.\n \n \n \n\n\n \n Yin, L.; Du, G.; and Liu, X.\n\n\n \n\n\n\n Journal of Semiconductors, 39(9): 094011. 2018.\n \n\n\n\n
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@article{yin2018impact,\n  title={Impact of ambient temperature on the self-heating effects in FinFETs},\n  author={Yin, Longxiang and Du, Gang and Liu, Xiaoyan},\n  journal={Journal of Semiconductors},\n  volume={39},\n  number={9},\n  pages={094011},\n  year={2018},\n  publisher={Chinese Institute of Electronics}\n}\n\n
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\n \n\n \n \n \n \n \n Impact of crystal orientation and surface scattering on DG-MOSFETs in quasi-ballistic region.\n \n \n \n\n\n \n Shen, L.; Di, S.; Yin, L.; Li, Y.; Liu, X.; and Du, G.\n\n\n \n\n\n\n Journal of Semiconductors, 39(7): 074002. 2018.\n \n\n\n\n
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@article{shen2018impact,\n  title={Impact of crystal orientation and surface scattering on DG-MOSFETs in quasi-ballistic region},\n  author={Shen, Lei and Di, Shaoyan and Yin, Longxiang and Li, Yun and Liu, Xiaoyan and Du, Gang},\n  journal={Journal of Semiconductors},\n  volume={39},\n  number={7},\n  pages={074002},\n  year={2018},\n  publisher={Chinese Institute of Electronics}\n}\n\n
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\n \n\n \n \n \n \n \n Impact of self-heating effects on nanoscale Ge p-channel FinFETs with Si substrate.\n \n \n \n\n\n \n Yin, L.; Shen, L.; Jiang, H.; Du, G.; and Liu, X.\n\n\n \n\n\n\n Science China Information Sciences, 61(6): 062401. 2018.\n \n\n\n\n
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@article{yin2018impact,\n  title={Impact of self-heating effects on nanoscale Ge p-channel FinFETs with Si substrate},\n  author={Yin, Longxiang and Shen, Lei and Jiang, Hai and Du, Gang and Liu, Xiaoyan},\n  journal={Science China Information Sciences},\n  volume={61},\n  number={6},\n  pages={062401},\n  year={2018},\n  publisher={Springer}\n}\n\n
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\n \n\n \n \n \n \n \n Investigation of thermal effects on FinFETs in the quasi-ballistic regime.\n \n \n \n\n\n \n Yin, L.; Shen, L.; Di, S.; Du, G.; and Liu, X.\n\n\n \n\n\n\n Japanese Journal of Applied Physics, 57(4S): 04FD14. 2018.\n \n\n\n\n
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@article{yin2018investigation,\n  title={Investigation of thermal effects on FinFETs in the quasi-ballistic regime},\n  author={Yin, Longxiang and Shen, Lei and Di, Shaoyan and Du, Gang and Liu, Xiaoyan},\n  journal={Japanese Journal of Applied Physics},\n  volume={57},\n  number={4S},\n  pages={04FD14},\n  year={2018},\n  publisher={The Japan Society of Applied Physics}\n}\n\n
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\n \n\n \n \n \n \n \n Calibration of drift-diffusion model in quasi-ballistic transport region for FinFETs.\n \n \n \n\n\n \n Shen, L.; Di, S.; Yin, L.; Liu, X.; and Du, G.\n\n\n \n\n\n\n Science China Information Sciences, 61(6): 062406. 2018.\n \n\n\n\n
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@article{shen2018calibration,\n  title={Calibration of drift-diffusion model in quasi-ballistic transport region for FinFETs},\n  author={Shen, Lei and Di, Shaoyan and Yin, Longxiang and Liu, Xiaoyan and Du, Gang},\n  journal={Science China Information Sciences},\n  volume={61},\n  number={6},\n  pages={062406},\n  year={2018},\n  publisher={Springer}\n}\n\n
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\n  \n 2017\n \n \n (4)\n \n \n
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\n \n\n \n \n \n \n \n Experimental investigation of ballistic carrier transport for sub-100-nm Ge n-MOSFETs.\n \n \n \n\n\n \n Cheng, R.; Yin, L.; Wu, H.; Yu, X.; Zhang, Y.; Zheng, Z.; Wu, W.; Chen, B.; Ye, P. D; Liu, X.; and others\n\n\n \n\n\n\n IEEE Electron Device Letters, 38(4): 434–437. 2017.\n \n\n\n\n
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@article{cheng2017experimental,\n  title={Experimental investigation of ballistic carrier transport for sub-100-nm Ge n-MOSFETs},\n  author={Cheng, Ran and Yin, Longxiang and Wu, Heng and Yu, Xiao and Zhang, Yanyan and Zheng, Zejie and Wu, Wangran and Chen, Bing and Ye, Peide D and Liu, Xiaoyan and others},\n  journal={IEEE Electron Device Letters},\n  volume={38},\n  number={4},\n  pages={434--437},\n  year={2017},\n  publisher={IEEE}\n}\n\n
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\n \n\n \n \n \n \n \n Impacts of diameter and Ge content variation on the performance of Si1-xGex p-channel gate-all-around nanowire transistors.\n \n \n \n\n\n \n Zhang, X.; Liu, X.; Yin, L.; and Du, G.\n\n\n \n\n\n\n IEEE Transactions on Nanotechnology, 17(1): 108–112. 2017.\n \n\n\n\n
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@article{zhang2017impacts,\n  title={Impacts of diameter and Ge content variation on the performance of Si1-xGex p-channel gate-all-around nanowire transistors},\n  author={Zhang, Xianle and Liu, Xiaoyan and Yin, Longxiang and Du, Gang},\n  journal={IEEE Transactions on Nanotechnology},\n  volume={17},\n  number={1},\n  pages={108--112},\n  year={2017},\n  publisher={IEEE}\n}\n\n
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\n \n\n \n \n \n \n \n Parameter calibration of drift-diffusion model in quasi-ballisitc transport region with Monte Carlo method.\n \n \n \n\n\n \n Shen, L.; Di, S.; Yin, L.; Liu, X.; and Du, G.\n\n\n \n\n\n\n In 2017 Silicon Nanoelectronics Workshop (SNW), pages 73–74, 2017. IEEE\n \n\n\n\n
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@inproceedings{shen2017parameter,\n  title={Parameter calibration of drift-diffusion model in quasi-ballisitc transport region with Monte Carlo method},\n  author={Shen, Lei and Di, Shaoyan and Yin, Longxiang and Liu, Xiaoyan and Du, Gang},\n  booktitle={2017 Silicon Nanoelectronics Workshop (SNW)},\n  pages={73--74},\n  year={2017},\n  organization={IEEE}\n}\n\n
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\n \n\n \n \n \n \n \n Ultrafast pulse characterization of hot carrier injection effects on ballistic carrier transport for sub-100 nm MOSFETs.\n \n \n \n\n\n \n Cheng, R.; Yu, X.; Shen, L.; Yin, L.; Zhang, Y.; Zheng, Z.; Chen, B.; Liu, X.; and Zhao, Y.\n\n\n \n\n\n\n In 2017 IEEE International Reliability Physics Symposium (IRPS), pages 3E–3, 2017. IEEE\n \n\n\n\n
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@inproceedings{cheng2017ultrafast,\n  title={Ultrafast pulse characterization of hot carrier injection effects on ballistic carrier transport for sub-100 nm MOSFETs},\n  author={Cheng, Ran and Yu, Xiao and Shen, Lei and Yin, Longxiang and Zhang, Yanyan and Zheng, Zejie and Chen, Bing and Liu, Xiaoyan and Zhao, Yi},\n  booktitle={2017 IEEE International Reliability Physics Symposium (IRPS)},\n  pages={3E--3},\n  year={2017},\n  organization={IEEE}\n}\n\n
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\n  \n 2016\n \n \n (3)\n \n \n
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\n \n\n \n \n \n \n \n Investigation the impact of composition on the performance of SiGe nanowire pMOSFETs by different simulation methods.\n \n \n \n\n\n \n Zhang, X.; Liu, X.; Wang, Y.; Yin, L.; and Du, G.\n\n\n \n\n\n\n In 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), pages 35–37, 2016. IEEE\n \n\n\n\n
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@inproceedings{zhang2016investigation,\n  title={Investigation the impact of composition on the performance of SiGe nanowire pMOSFETs by different simulation methods},\n  author={Zhang, Xianle and Liu, Xiaoyan and Wang, Yijiao and Yin, Longxiang and Du, Gang},\n  booktitle={2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)},\n  pages={35--37},\n  year={2016},\n  organization={IEEE}\n}\n\n
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\n \n\n \n \n \n \n \n Investigation of local heating effect for 14nm Ge pFinFETs based on Monte Carlo method.\n \n \n \n\n\n \n Yin, L.; Jiang, H.; Shen, L.; Wang, J.; Du, G.; and Liu, X.\n\n\n \n\n\n\n In 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), pages 1–2, 2016. IEEE\n \n\n\n\n
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@inproceedings{yin2016investigation,\n  title={Investigation of local heating effect for 14nm Ge pFinFETs based on Monte Carlo method},\n  author={Yin, Longxiang and Jiang, Hai and Shen, Lei and Wang, JunCheng and Du, Gang and Liu, Xiaoyan},\n  booktitle={2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)},\n  pages={1--2},\n  year={2016},\n  organization={IEEE}\n}\n\n
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\n \n\n \n \n \n \n \n Simulation method for forming and switching processes of NbO2-based selector.\n \n \n \n\n\n \n Hu, J.; Zhao, Y.; Yin, L.; Lun, Z.; Huang, P.; Kang, J.; and Liu, X.\n\n\n \n\n\n\n In 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), pages 1116–1118, 2016. IEEE\n \n\n\n\n
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@inproceedings{hu2016simulation,\n  title={Simulation method for forming and switching processes of NbO2-based selector},\n  author={Hu, Junjie and Zhao, Yudi and Yin, Longxiang and Lun, Zhiyuan and Huang, Peng and Kang, Jinfeng and Liu, Xiaoyan},\n  booktitle={2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)},\n  pages={1116--1118},\n  year={2016},\n  organization={IEEE}\n}\n\n
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\n  \n 2015\n \n \n (3)\n \n \n
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\n \n\n \n \n \n \n \n Accelerated 3D full band self-consistent ensemble Monte Carlo device simulation utilizing intel MIC co-processors on tianhe II.\n \n \n \n\n\n \n Yin, L.; Fang, M.; Zeng, L.; Zhang, L.; Du, G.; and Liu, X.\n\n\n \n\n\n\n In 2015 International Workshop on Computational Electronics (IWCE), pages 1–4, 2015. IEEE\n \n\n\n\n
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@inproceedings{yin2015accelerated,\n  title={Accelerated 3D full band self-consistent ensemble Monte Carlo device simulation utilizing intel MIC co-processors on tianhe II},\n  author={Yin, Longxiang and Fang, Minquaan and Zeng, Lang and Zhang, Lilun and Du, Gang and Liu, Xxiaoyan},\n  booktitle={2015 International Workshop on Computational Electronics (IWCE)},\n  pages={1--4},\n  year={2015},\n  organization={IEEE}\n}\n\n
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\n \n\n \n \n \n \n \n Comprehensive understanding of hot carrier degradation in multiple-fin SOI FinFETs.\n \n \n \n\n\n \n Jiang, H.; Yin, L.; Li, Y.; Xu, N.; Zhao, K.; He, Y.; Du, G.; Liu, X.; and Zhang, X.\n\n\n \n\n\n\n In 2015 IEEE International Reliability Physics Symposium, pages XT–6, 2015. IEEE\n \n\n\n\n
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@inproceedings{jiang2015comprehensive,\n  title={Comprehensive understanding of hot carrier degradation in multiple-fin SOI FinFETs},\n  author={Jiang, Hai and Yin, Longxiang and Li, Yun and Xu, Nuo and Zhao, Kai and He, Yandong and Du, Gang and Liu, Xiaoyan and Zhang, Xing},\n  booktitle={2015 IEEE International Reliability Physics Symposium},\n  pages={XT--6},\n  year={2015},\n  organization={IEEE}\n}\n\n
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\n \n\n \n \n \n \n \n A 3-Dimension Monte Carlo simulator for semiconductor devices based on many integrated core.\n \n \n \n\n\n \n Min-quan, F.; Wei-min, Z.; Li-lun, Z.; Lang, Z.; Xiao-yan, L.; and Long-xiang, Y.\n\n\n \n\n\n\n Computer Engineering & Science/Jisuanji Gongcheng yu Kexue, 37(4). 2015.\n \n\n\n\n
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@article{min20153,\n  title={A 3-Dimension Monte Carlo simulator for semiconductor devices based on many integrated core.},\n  author={Min-quan, FANG and Wei-min, ZHANG and Li-lun, ZHANG and Lang, ZENG and Xiao-yan, LIU and Long-xiang, YIN},\n  journal={Computer Engineering \\& Science/Jisuanji Gongcheng yu Kexue},\n  volume={37},\n  number={4},\n  year={2015}\n}\n\n
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\n  \n 2014\n \n \n (1)\n \n \n
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\n \n\n \n \n \n \n \n Three dimemsional electro-thermal coupled Monte Carlo device simulation.\n \n \n \n\n\n \n Liu, X.; Wei, K.; Yin, L.; Du, G.; Jiang, H.; Zhao, K.; Zeng, L.; and Zhang, X.\n\n\n \n\n\n\n In 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), pages 1–4, 2014. IEEE\n \n\n\n\n
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@inproceedings{liu2014three,\n  title={Three dimemsional electro-thermal coupled Monte Carlo device simulation},\n  author={Liu, Xiaoyan and Wei, Kangliang and Yin, Longxiang and Du, Gang and Jiang, Hai and Zhao, Kai and Zeng, Lang and Zhang, Xing},\n  booktitle={2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)},\n  pages={1--4},\n  year={2014},\n  organization={IEEE}\n}\n\n
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