@INPROCEEDINGS{Sabane13-CSMR-CostUnitTestAntipatterns,
   AUTHOR       = {Aminata Saban� and Di Penta, Massimiliano and 
      Giuliano Antoniol and Yann-Ga�l Gu�h�neuc},
   BOOKTITLE    = {Proceedings of the 17<sup>th</sup> European Conference on Software Maintenance and Reengineering (CSMR)},
   TITLE        = {A Study on the Relation Between Antipatterns and the 
      Cost of Class Unit Testing},
   YEAR         = {2013},
   OPTADDRESS   = {},
   OPTCROSSREF  = {},
   EDITOR       = {Anthony Cleve and Filippo Ricca},
   MONTH        = {March},
   NOTE         = {10 pages.},
   OPTNUMBER    = {},
   OPTORGANIZATION = {},
   PAGES        = {167--176},
   PUBLISHER    = {IEEE CS Press},
   OPTSERIES    = {},
   OPTVOLUME    = {},
   KEYWORDS     = {Topic: <b>Test case generation</b>, Venue: <c>CSMR</c>},
   URL          = {http://www.ptidej.net/publications/documents/CSMR13a.doc.pdf},
   PDF          = {http://www.ptidej.net/publications/documents/CSMR13a.ppt.pdf},
   ABSTRACT     = {Antipatterns are known as recurring, poor design 
      choices; recent and past studies indicated that they negatively 
      affect software systems in terms of understandability and 
      maintainability, also increasing change-and defect-proneness. For 
      this reason, refactoring actions are often suggested. In this paper, 
      we investigate a different side-effect of antipatterns, which is 
      their effect on testability and on testing cost in particular. We 
      consider as (upper bound) indicator of testing cost the number of 
      test cases that satisfy the minimal data member usage matrix (MaDUM) 
      criterion proposed by Bashir and Goel. A study---carried out on four 
      Java programs, Ant 1.8.3, ArgoUML 0.20, CheckStyle 4.0, and 
      JFreeChart 1.0.13---supports the evidence that, on the one hand, 
      antipatterns unit testing requires, on average, a number of test 
      cases substantially higher than unit testing for non-antipattern 
      classes. On the other hand, antipattern classes must be carefully 
      tested because they are more defect-prone than other classes. 
      Finally, we illustrate how specific refactoring actions---applied to 
      classes participating in antipatterns---could reduce testing cost.}
}

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For this reason, refactoring actions are often suggested. In this paper, we investigate a different side-effect of antipatterns, which is their effect on testability and on testing cost in particular. We consider as (upper bound) indicator of testing cost the number of test cases that satisfy the minimal data member usage matrix (MaDUM) criterion proposed by Bashir and Goel. A study—carried out on four Java programs, Ant 1.8.3, ArgoUML 0.20, CheckStyle 4.0, and JFreeChart 1.0.13—supports the evidence that, on the one hand, antipatterns unit testing requires, on average, a number of test cases substantially higher than unit testing for non-antipattern classes. On the other hand, antipattern classes must be carefully tested because they are more defect-prone than other classes. Finally, we illustrate how specific refactoring actions—applied to classes participating in antipatterns—could reduce testing cost.","bibtex":"@INPROCEEDINGS{Sabane13-CSMR-CostUnitTestAntipatterns,\r\n AUTHOR = {Aminata Saban� and Di Penta, Massimiliano and \r\n Giuliano Antoniol and Yann-Ga�l Gu�h�neuc},\r\n BOOKTITLE = {Proceedings of the 17^th European Conference on Software Maintenance and Reengineering (CSMR)},\r\n TITLE = {A Study on the Relation Between Antipatterns and the \r\n Cost of Class Unit Testing},\r\n YEAR = {2013},\r\n OPTADDRESS = {},\r\n OPTCROSSREF = {},\r\n EDITOR = {Anthony Cleve and Filippo Ricca},\r\n MONTH = {March},\r\n NOTE = {10 pages.},\r\n OPTNUMBER = {},\r\n OPTORGANIZATION = {},\r\n PAGES = {167--176},\r\n PUBLISHER = {IEEE CS Press},\r\n OPTSERIES = {},\r\n OPTVOLUME = {},\r\n KEYWORDS = {Topic: <b>Test case generation</b>, Venue: <c>CSMR</c>},\r\n URL = {http://www.ptidej.net/publications/documents/CSMR13a.doc.pdf},\r\n PDF = {http://www.ptidej.net/publications/documents/CSMR13a.ppt.pdf},\r\n ABSTRACT = {Antipatterns are known as recurring, poor design \r\n choices; recent and past studies indicated that they negatively \r\n affect software systems in terms of understandability and \r\n maintainability, also increasing change-and defect-proneness. For \r\n this reason, refactoring actions are often suggested. In this paper, \r\n we investigate a different side-effect of antipatterns, which is \r\n their effect on testability and on testing cost in particular. We \r\n consider as (upper bound) indicator of testing cost the number of \r\n test cases that satisfy the minimal data member usage matrix (MaDUM) \r\n criterion proposed by Bashir and Goel. A study---carried out on four \r\n Java programs, Ant 1.8.3, ArgoUML 0.20, CheckStyle 4.0, and \r\n JFreeChart 1.0.13---supports the evidence that, on the one hand, \r\n antipatterns unit testing requires, on average, a number of test \r\n cases substantially higher than unit testing for non-antipattern \r\n classes. On the other hand, antipattern classes must be carefully \r\n tested because they are more defect-prone than other classes. \r\n Finally, we illustrate how specific refactoring actions---applied to \r\n classes participating in antipatterns---could reduce testing cost.}\r\n}\r\n\r\n","author_short":["Saban�, A.","Di Penta, M.","Antoniol, G.","Gu�h�neuc, Y."],"editor_short":["Cleve, A.","Ricca, F."],"key":"Sabane13-CSMR-CostUnitTestAntipatterns","id":"Sabane13-CSMR-CostUnitTestAntipatterns","bibbaseid":"saban-dipenta-antoniol-guhneuc-astudyontherelationbetweenantipatternsandthecostofclassunittesting-2013","role":"author","urls":{"Paper":"http://www.ptidej.net/publications/documents/CSMR13a.doc.pdf"},"keyword":["Topic: <b>Test case generation</b>","Venue: <c>CSMR</c>"],"metadata":{"authorlinks":{"gu�h�neuc, y":"https://bibbase.org/show?bib=http%3A%2F%2Fwww.yann-gael.gueheneuc.net%2FWork%2FPublications%2FBiblio%2Fcomplete-bibliography.bib&msg=embed","guéhéneuc, 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