A Study on the Relation Between Antipatterns and the Cost of Class Unit Testing. Saban�, A., Di Penta, M., Antoniol, G., & Gu�h�neuc, Y. In Cleve, A. & Ricca, F., editors, Proceedings of the 17<sup>th</sup> European Conference on Software Maintenance and Reengineering (CSMR), pages 167–176, March, 2013. IEEE CS Press. 10 pages.
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Paper abstract bibtex
Paper abstract bibtex Antipatterns are known as recurring, poor design choices; recent and past studies indicated that they negatively affect software systems in terms of understandability and maintainability, also increasing change-and defect-proneness. For this reason, refactoring actions are often suggested. In this paper, we investigate a different side-effect of antipatterns, which is their effect on testability and on testing cost in particular. We consider as (upper bound) indicator of testing cost the number of test cases that satisfy the minimal data member usage matrix (MaDUM) criterion proposed by Bashir and Goel. A study—carried out on four Java programs, Ant 1.8.3, ArgoUML 0.20, CheckStyle 4.0, and JFreeChart 1.0.13—supports the evidence that, on the one hand, antipatterns unit testing requires, on average, a number of test cases substantially higher than unit testing for non-antipattern classes. On the other hand, antipattern classes must be carefully tested because they are more defect-prone than other classes. Finally, we illustrate how specific refactoring actions—applied to classes participating in antipatterns—could reduce testing cost.
@INPROCEEDINGS{Sabane13-CSMR-CostUnitTestAntipatterns,
AUTHOR = {Aminata Saban� and Di Penta, Massimiliano and
Giuliano Antoniol and Yann-Ga�l Gu�h�neuc},
BOOKTITLE = {Proceedings of the 17<sup>th</sup> European Conference on Software Maintenance and Reengineering (CSMR)},
TITLE = {A Study on the Relation Between Antipatterns and the
Cost of Class Unit Testing},
YEAR = {2013},
OPTADDRESS = {},
OPTCROSSREF = {},
EDITOR = {Anthony Cleve and Filippo Ricca},
MONTH = {March},
NOTE = {10 pages.},
OPTNUMBER = {},
OPTORGANIZATION = {},
PAGES = {167--176},
PUBLISHER = {IEEE CS Press},
OPTSERIES = {},
OPTVOLUME = {},
KEYWORDS = {Topic: <b>Test case generation</b>, Venue: <c>CSMR</c>},
URL = {http://www.ptidej.net/publications/documents/CSMR13a.doc.pdf},
PDF = {http://www.ptidej.net/publications/documents/CSMR13a.ppt.pdf},
ABSTRACT = {Antipatterns are known as recurring, poor design
choices; recent and past studies indicated that they negatively
affect software systems in terms of understandability and
maintainability, also increasing change-and defect-proneness. For
this reason, refactoring actions are often suggested. In this paper,
we investigate a different side-effect of antipatterns, which is
their effect on testability and on testing cost in particular. We
consider as (upper bound) indicator of testing cost the number of
test cases that satisfy the minimal data member usage matrix (MaDUM)
criterion proposed by Bashir and Goel. A study---carried out on four
Java programs, Ant 1.8.3, ArgoUML 0.20, CheckStyle 4.0, and
JFreeChart 1.0.13---supports the evidence that, on the one hand,
antipatterns unit testing requires, on average, a number of test
cases substantially higher than unit testing for non-antipattern
classes. On the other hand, antipattern classes must be carefully
tested because they are more defect-prone than other classes.
Finally, we illustrate how specific refactoring actions---applied to
classes participating in antipatterns---could reduce testing cost.}
}Downloads: 0
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