Improving Test Generation under Rich Contracts by Tight Bounds and Incremental SAT Solving. Abad, P., Aguirre, N., Bengolea, V. S., Ciolek, D., Frias, M. F., Galeotti, J. P., Maibaum, T., Moscato, M. M., Rosner, N., & Vissani, I. In Sixth IEEE International Conference on Software Testing, Verification and Validation, ICST 2013, Luxembourg, Luxembourg, March 18-22, 2013, pages 21–30, 2013. IEEE Computer Society. Paper doi bibtex @inproceedings{DBLP:conf/icst/AbadABCFGMMRV13,
author = {Pablo Abad and Nazareno Aguirre and Valeria S. Bengolea and Daniel Ciolek and Marcelo F. Frias and Juan P. Galeotti and Tom Maibaum and Mariano M. Moscato and Nicol{\'{a}}s Rosner and Ignacio Vissani},
bibsource = {dblp computer science bibliography, https://dblp.org},
biburl = {https://dblp.org/rec/conf/icst/AbadABCFGMMRV13.bib},
booktitle = {Sixth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2013, Luxembourg, Luxembourg, March 18-22, 2013},
doi = {10.1109/ICST.2013.46},
pages = {21--30},
publisher = {{IEEE} Computer Society},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
title = {Improving Test Generation under Rich Contracts by Tight Bounds and Incremental {SAT} Solving},
url = {https://doi.org/10.1109/ICST.2013.46},
year = {2013},
Bdsk-Url-1 = {https://doi.org/10.1109/ICST.2013.46},
Bdsk-Url-2 = {http://dx.doi.org/10.1109/ICST.2013.46}}
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