Affect Intensity Analysis of Dark Web Forums. Abbasi, A. & Chen, H. In 2007 IEEE Intelligence and Security Informatics, pages 282–288, New Brunswick, NJ, USA, May, 2007. IEEE.
Affect Intensity Analysis of Dark Web Forums [link]Paper  doi  bibtex   
@inproceedings{abbasi_affect_2007,
	address = {New Brunswick, NJ, USA},
	title = {Affect {Intensity} {Analysis} of {Dark} {Web} {Forums}},
	isbn = {978-1-4244-1329-4},
	url = {http://ieeexplore.ieee.org/document/4258712/},
	doi = {10.1109/ISI.2007.379486},
	urldate = {2023-07-25},
	booktitle = {2007 {IEEE} {Intelligence} and {Security} {Informatics}},
	publisher = {IEEE},
	author = {Abbasi, Ahmed and Chen, Hsinchun},
	month = may,
	year = {2007},
	pages = {282--288},
}

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