Reliability characterization of mixed-signal chip. Abel, C., Michael, C., Ismail, M., Teng, C., & Lahri, R. IEEE Circuits and Devices Magazine, 1997.
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 title = {Reliability characterization of mixed-signal chip},
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 year = {1997},
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 volume = {13},
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 author = {Abel, C. and Michael, C. and Ismail, M. and Teng, C.S. and Lahri, R.},
 journal = {IEEE Circuits and Devices Magazine},
 number = {4}
}

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