Security, Reliability and Test Aspects of the RISC-V Ecosystem

Security, Reliability and Test Aspects of the RISC-V Ecosystem. Abella, J., Alcaide, S., Anders, J., Bas, F., Becker, S., Mulder, E. D., Elhamawy, N., Gürkaynak, F. K., Handschuh, H., Hernández, C., Hutter, M., Kosmidis, L., Polian, I., Sauer, M., Wagner, S., & Regazzoni, F. In 26th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, May 24-28, 2021, pages 1–10, 2021. IEEE.

Paper doi bibtex

@inproceedings{DBLP:conf/ets/0001AAB0MEGHHHK21,
  author    = {Jaume Abella and
               Sergi Alcaide and
               Jens Anders and
               Francisco Bas and
               Steffen Becker and
               Elke De Mulder and
               Nourhan Elhamawy and
               Frank K. G{\"{u}}rkaynak and
               Helena Handschuh and
               Carles Hern{\'{a}}ndez and
               Mike Hutter and
               Leonidas Kosmidis and
               Ilia Polian and
               Matthias Sauer and
               Stefan Wagner and
               Francesco Regazzoni},
  title     = {Security, Reliability and Test Aspects of the {RISC-V} Ecosystem},
  booktitle = {26th {IEEE} European Test Symposium, {ETS} 2021, Bruges, Belgium,
               May 24-28, 2021},
  pages     = {1--10},
  publisher = {{IEEE}},
  year      = {2021},
  url       = {https://doi.org/10.1109/ETS50041.2021.9465449},
  doi       = {10.1109/ETS50041.2021.9465449},
  timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/ets/0001AAB0MEGHHHK21.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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