@article{journals/micro/AbellaVUEGT08,
  added-at = {2016-01-15T00:00:00.000+0100},
  author = {Abella, Jaume and Vera, Xavier and Unsal, Osman S. and Ergin, Oguz and González, Antonio and Tschanz, James W.},
  biburl = {http://www.bibsonomy.org/bibtex/22942a608ef2c7d767cd8bfce4acc5c21/dblp},
  ee = {http://doi.ieeecomputersociety.org/10.1109/MM.2008.92},
  interhash = {bcdd664ad5b97967adcfeb923d8e570f},
  intrahash = {2942a608ef2c7d767cd8bfce4acc5c21},
  journal = {IEEE Micro},
  keywords = {dblp},
  number = 6,
  pages = {37-46},
  timestamp = {2016-01-16T11:34:56.000+0100},
  title = {Refueling: Preventing Wire Degradation due to Electromigration.},
  url = {http://dblp.uni-trier.de/db/journals/micro/micro28.html#AbellaVUEGT08},
  volume = 28,
  year = 2008
}

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