@inproceedings{adam2018wafer,
  title={Wafer Quality Inspection using Memristive LSTM, ANN, DNN and HTM},
  author={Adam, Kazybek and Smagulova, Kamilya and Krestinskaya, Olga and James, Alex Pappachen},
  booktitle={IEEE Electrical Design of Advanced Packaging and Systems Symposium},
  year={2018}
}

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