@article{journals/mr/AfacanDB14,
  added-at = {2014-08-06T00:00:00.000+0200},
  author = {Afacan, Engin and Dündar, Günhan and Baskaya, I. Faik},
  biburl = {http://www.bibsonomy.org/bibtex/2f1d609aed9684adf81ab91b2be891b79/dblp},
  ee = {http://dx.doi.org/10.1016/j.microrel.2013.08.013},
  interhash = {5ab1941affa792f254c2d61397d329dd},
  intrahash = {f1d609aed9684adf81ab91b2be891b79},
  journal = {Microelectronics Reliability},
  keywords = {dblp},
  number = 2,
  pages = {397-403},
  timestamp = {2015-06-17T21:53:24.000+0200},
  title = {Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena.},
  url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#AfacanDB14},
  volume = 54,
  year = 2014
}

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