The survivability of design-specific spare placement in FPGA architectures with high defect rates. Agarwal, A., Cong, J., & Tagiku, B. ACM Trans. Design Autom. Electr. Syst., 18(2):33:1-33:22, 2013.
The survivability of design-specific spare placement in FPGA architectures with high defect rates. [link]Link  The survivability of design-specific spare placement in FPGA architectures with high defect rates. [link]Paper  bibtex   
@article{journals/todaes/AgarwalCT13,
  added-at = {2025-01-19T00:00:00.000+0100},
  author = {Agarwal, Amit and Cong, Jason and Tagiku, Brian},
  biburl = {https://www.bibsonomy.org/bibtex/2ad0aa34b33b9e376860899acd0fc484a/dblp},
  ee = {https://www.wikidata.org/entity/Q130876055},
  interhash = {e389f3433d74086aa6a502a287be91a5},
  intrahash = {ad0aa34b33b9e376860899acd0fc484a},
  journal = {ACM Trans. Design Autom. Electr. Syst.},
  keywords = {dblp},
  number = 2,
  pages = {33:1-33:22},
  timestamp = {2025-01-27T07:15:57.000+0100},
  title = {The survivability of design-specific spare placement in FPGA architectures with high defect rates.},
  url = {http://dblp.uni-trier.de/db/journals/todaes/todaes18.html#AgarwalCT13},
  volume = 18,
  year = 2013
}

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