Temperature-Aware SoC Test Scheduling Considering Inter-Chip Process Variation. Aghaee, N., He, Z., Peng, Z., & Eles, P. In Asian Test Symposium, pages 395-398, 2010. IEEE Computer Society. ![Temperature-Aware SoC Test Scheduling Considering Inter-Chip Process Variation. [link]](https://bibbase.org/img/filetypes/link.svg "link")
Link Paper bibtex @inproceedings{ conf/ats/AghaeeHPE10,
added-at = {2011-01-31T00:00:00.000+0100},
author = {Aghaee, Nima and He, Zhiyuan and Peng, Zebo and Eles, Petru},
biburl = {http://www.bibsonomy.org/bibtex/23a1d067de8dde3de9df6b6b4a5391bc4/dblp},
booktitle = {Asian Test Symposium},
crossref = {conf/ats/2010},
ee = {http://dx.doi.org/10.1109/ATS.2010.74},
interhash = {935dd22ea1ee2c9d7812aff89dbd758c},
intrahash = {3a1d067de8dde3de9df6b6b4a5391bc4},
isbn = {978-0-7695-4248-5},
keywords = {dblp},
pages = {395-398},
publisher = {IEEE Computer Society},
title = {Temperature-Aware SoC Test Scheduling Considering Inter-Chip Process Variation.},
url = {http://dblp.uni-trier.de/db/conf/ats/ats2010.html#AghaeeHPE10},
year = {2010}
}
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{"_id":"MnLNxMYTEwmxNaZTY","bibbaseid":"aghaee-he-peng-eles-temperatureawaresoctestschedulingconsideringinterchipprocessvariation-2010","downloads":0,"creationDate":"2015-06-10T17:04:20.623Z","title":"Temperature-Aware SoC Test Scheduling Considering Inter-Chip Process Variation.","author_short":["Aghaee, N.","He, Z.","Peng, Z.","Eles, P."],"year":2010,"bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bib/author/Petru Eles?items=1000","bibdata":{"added-at":"2011-01-31T00:00:00.000+0100","author":["Aghaee, Nima","He, Zhiyuan","Peng, Zebo","Eles, Petru"],"author_short":["Aghaee, N.","He, Z.","Peng, Z.","Eles, P."],"bibtex":"@inproceedings{ conf/ats/AghaeeHPE10,\n added-at = {2011-01-31T00:00:00.000+0100},\n author = {Aghaee, Nima and He, Zhiyuan and Peng, Zebo and Eles, Petru},\n biburl = {http://www.bibsonomy.org/bibtex/23a1d067de8dde3de9df6b6b4a5391bc4/dblp},\n booktitle = {Asian Test Symposium},\n crossref = {conf/ats/2010},\n ee = {http://dx.doi.org/10.1109/ATS.2010.74},\n interhash = {935dd22ea1ee2c9d7812aff89dbd758c},\n intrahash = {3a1d067de8dde3de9df6b6b4a5391bc4},\n isbn = {978-0-7695-4248-5},\n keywords = {dblp},\n pages = {395-398},\n publisher = {IEEE Computer Society},\n title = {Temperature-Aware SoC Test Scheduling Considering Inter-Chip Process Variation.},\n url = {http://dblp.uni-trier.de/db/conf/ats/ats2010.html#AghaeeHPE10},\n year = {2010}\n}","bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bibtex/23a1d067de8dde3de9df6b6b4a5391bc4/dblp","booktitle":"Asian Test Symposium","crossref":"conf/ats/2010","ee":"http://dx.doi.org/10.1109/ATS.2010.74","id":"conf/ats/AghaeeHPE10","interhash":"935dd22ea1ee2c9d7812aff89dbd758c","intrahash":"3a1d067de8dde3de9df6b6b4a5391bc4","isbn":"978-0-7695-4248-5","key":"conf/ats/AghaeeHPE10","keywords":"dblp","pages":"395-398","publisher":"IEEE Computer Society","title":"Temperature-Aware SoC Test Scheduling Considering Inter-Chip Process Variation.","type":"inproceedings","url":"http://dblp.uni-trier.de/db/conf/ats/ats2010.html#AghaeeHPE10","year":"2010","bibbaseid":"aghaee-he-peng-eles-temperatureawaresoctestschedulingconsideringinterchipprocessvariation-2010","role":"author","urls":{"Link":"http://dx.doi.org/10.1109/ATS.2010.74","Paper":"http://dblp.uni-trier.de/db/conf/ats/ats2010.html#AghaeeHPE10"},"keyword":["dblp"],"downloads":0},"search_terms":["temperature","aware","soc","test","scheduling","considering","inter","chip","process","variation","aghaee","he","peng","eles"],"keywords":["dblp"],"authorIDs":[],"dataSources":["psAZ6PHwL3HTwJ9Q9"]}