@article{ journals/et/AghaeePE13,
  added-at = {2013-09-05T00:00:00.000+0200},
  author = {Aghaee, Nima and Peng, Zebo and Eles, Petru},
  biburl = {http://www.bibsonomy.org/bibtex/2282be4eab88f901c0d80a76e9be0a786/dblp},
  ee = {http://dx.doi.org/10.1007/s10836-013-5374-z},
  interhash = {70a3ad3ba675df3f1ae03adbd7d8f592},
  intrahash = {282be4eab88f901c0d80a76e9be0a786},
  journal = {J. Electronic Testing},
  keywords = {dblp},
  number = {4},
  pages = {499-520},
  title = {Process-Variation and Temperature Aware SoC Test Scheduling Technique.},
  url = {http://dblp.uni-trier.de/db/journals/et/et29.html#AghaeePE13},
  volume = {29},
  year = {2013}
}

{"_id":"C4TNQow5LZZ8aCcPq","bibbaseid":"aghaee-peng-eles-processvariationandtemperatureawaresoctestschedulingtechnique-2013","downloads":0,"creationDate":"2015-06-10T17:04:20.222Z","title":"Process-Variation and Temperature Aware SoC Test Scheduling Technique.","author_short":["Aghaee, N.","Peng, Z.","Eles, P."],"year":2013,"bibtype":"article","biburl":"http://www.bibsonomy.org/bib/author/Petru Eles?items=1000","bibdata":{"added-at":"2013-09-05T00:00:00.000+0200","author":["Aghaee, Nima","Peng, Zebo","Eles, Petru"],"author_short":["Aghaee, N.","Peng, Z.","Eles, P."],"bibtex":"@article{ journals/et/AghaeePE13,\n added-at = {2013-09-05T00:00:00.000+0200},\n author = {Aghaee, Nima and Peng, Zebo and Eles, Petru},\n biburl = {http://www.bibsonomy.org/bibtex/2282be4eab88f901c0d80a76e9be0a786/dblp},\n ee = {http://dx.doi.org/10.1007/s10836-013-5374-z},\n interhash = {70a3ad3ba675df3f1ae03adbd7d8f592},\n intrahash = {282be4eab88f901c0d80a76e9be0a786},\n journal = {J. Electronic Testing},\n keywords = {dblp},\n number = {4},\n pages = {499-520},\n title = {Process-Variation and Temperature Aware SoC Test Scheduling Technique.},\n url = {http://dblp.uni-trier.de/db/journals/et/et29.html#AghaeePE13},\n volume = {29},\n year = {2013}\n}","bibtype":"article","biburl":"http://www.bibsonomy.org/bibtex/2282be4eab88f901c0d80a76e9be0a786/dblp","ee":"http://dx.doi.org/10.1007/s10836-013-5374-z","id":"journals/et/AghaeePE13","interhash":"70a3ad3ba675df3f1ae03adbd7d8f592","intrahash":"282be4eab88f901c0d80a76e9be0a786","journal":"J. Electronic Testing","key":"journals/et/AghaeePE13","keywords":"dblp","number":"4","pages":"499-520","title":"Process-Variation and Temperature Aware SoC Test Scheduling Technique.","type":"article","url":"http://dblp.uni-trier.de/db/journals/et/et29.html#AghaeePE13","volume":"29","year":"2013","bibbaseid":"aghaee-peng-eles-processvariationandtemperatureawaresoctestschedulingtechnique-2013","role":"author","urls":{"Link":"http://dx.doi.org/10.1007/s10836-013-5374-z","Paper":"http://dblp.uni-trier.de/db/journals/et/et29.html#AghaeePE13"},"keyword":["dblp"],"downloads":0},"search_terms":["process","variation","temperature","aware","soc","test","scheduling","technique","aghaee","peng","eles"],"keywords":["dblp"],"authorIDs":[],"dataSources":["psAZ6PHwL3HTwJ9Q9"]}