Process-Variation Aware Multi-temperature Test Scheduling. Aghaee, N., Peng, Z., & Eles, P. In VLSI Design, pages 32-37, 2014. IEEE Computer Society.
Process-Variation Aware Multi-temperature Test Scheduling. [link]Link  Process-Variation Aware Multi-temperature Test Scheduling. [link]Paper  bibtex   
@inproceedings{ conf/vlsid/AghaeePE14,
  added-at = {2015-04-20T00:00:00.000+0200},
  author = {Aghaee, Nima and Peng, Zebo and Eles, Petru},
  biburl = {http://www.bibsonomy.org/bibtex/213f29df7613646581d6e210a3be3dcab/dblp},
  booktitle = {VLSI Design},
  crossref = {conf/vlsid/2014},
  ee = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2014.13},
  interhash = {ae20a9e1ddd4c65167705666d61265ce},
  intrahash = {13f29df7613646581d6e210a3be3dcab},
  isbn = {978-1-4799-2513-1},
  keywords = {dblp},
  pages = {32-37},
  publisher = {IEEE Computer Society},
  title = {Process-Variation Aware Multi-temperature Test Scheduling.},
  url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2014.html#AghaeePE14},
  year = {2014}
}

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