Process-Variation Aware Multi-temperature Test Scheduling. Aghaee, N., Peng, Z., & Eles, P. In VLSI Design, pages 32-37, 2014. IEEE Computer Society. Link Paper bibtex @inproceedings{ conf/vlsid/AghaeePE14,
added-at = {2015-04-20T00:00:00.000+0200},
author = {Aghaee, Nima and Peng, Zebo and Eles, Petru},
biburl = {http://www.bibsonomy.org/bibtex/213f29df7613646581d6e210a3be3dcab/dblp},
booktitle = {VLSI Design},
crossref = {conf/vlsid/2014},
ee = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2014.13},
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isbn = {978-1-4799-2513-1},
keywords = {dblp},
pages = {32-37},
publisher = {IEEE Computer Society},
title = {Process-Variation Aware Multi-temperature Test Scheduling.},
url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2014.html#AghaeePE14},
year = {2014}
}
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