@inproceedings{ conf/icecsys/AghaeePE13,
  added-at = {2015-03-10T00:00:00.000+0100},
  author = {Aghaee, Nima and Peng, Zebo and Eles, Petru},
  biburl = {http://www.bibsonomy.org/bibtex/257ae7ad77266002d5e55ced5d10dc924/dblp},
  booktitle = {ICECS},
  crossref = {conf/icecsys/2013},
  ee = {http://dx.doi.org/10.1109/ICECS.2013.6815440},
  interhash = {f1c8402a382c07bd5c680fb9f3b91cae},
  intrahash = {57ae7ad77266002d5e55ced5d10dc924},
  keywords = {dblp},
  pages = {405-408},
  publisher = {IEEE},
  title = {Temperature-gradient based test scheduling for 3D stacked ICs.},
  url = {http://dblp.uni-trier.de/db/conf/icecsys/icecsys2013.html#AghaeePE13},
  year = {2013}
}

{"_id":"M5AHi3sEBm7fY2z5K","bibbaseid":"aghaee-peng-eles-temperaturegradientbasedtestschedulingfor3dstackedics-2013","downloads":0,"creationDate":"2015-06-10T17:04:19.948Z","title":"Temperature-gradient based test scheduling for 3D stacked ICs.","author_short":["Aghaee, N.","Peng, Z.","Eles, P."],"year":2013,"bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bib/author/Petru Eles?items=1000","bibdata":{"added-at":"2015-03-10T00:00:00.000+0100","author":["Aghaee, Nima","Peng, Zebo","Eles, Petru"],"author_short":["Aghaee, N.","Peng, Z.","Eles, P."],"bibtex":"@inproceedings{ conf/icecsys/AghaeePE13,\n added-at = {2015-03-10T00:00:00.000+0100},\n author = {Aghaee, Nima and Peng, Zebo and Eles, Petru},\n biburl = {http://www.bibsonomy.org/bibtex/257ae7ad77266002d5e55ced5d10dc924/dblp},\n booktitle = {ICECS},\n crossref = {conf/icecsys/2013},\n ee = {http://dx.doi.org/10.1109/ICECS.2013.6815440},\n interhash = {f1c8402a382c07bd5c680fb9f3b91cae},\n intrahash = {57ae7ad77266002d5e55ced5d10dc924},\n keywords = {dblp},\n pages = {405-408},\n publisher = {IEEE},\n title = {Temperature-gradient based test scheduling for 3D stacked ICs.},\n url = {http://dblp.uni-trier.de/db/conf/icecsys/icecsys2013.html#AghaeePE13},\n year = {2013}\n}","bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bibtex/257ae7ad77266002d5e55ced5d10dc924/dblp","booktitle":"ICECS","crossref":"conf/icecsys/2013","ee":"http://dx.doi.org/10.1109/ICECS.2013.6815440","id":"conf/icecsys/AghaeePE13","interhash":"f1c8402a382c07bd5c680fb9f3b91cae","intrahash":"57ae7ad77266002d5e55ced5d10dc924","key":"conf/icecsys/AghaeePE13","keywords":"dblp","pages":"405-408","publisher":"IEEE","title":"Temperature-gradient based test scheduling for 3D stacked ICs.","type":"inproceedings","url":"http://dblp.uni-trier.de/db/conf/icecsys/icecsys2013.html#AghaeePE13","year":"2013","bibbaseid":"aghaee-peng-eles-temperaturegradientbasedtestschedulingfor3dstackedics-2013","role":"author","urls":{"Link":"http://dx.doi.org/10.1109/ICECS.2013.6815440","Paper":"http://dblp.uni-trier.de/db/conf/icecsys/icecsys2013.html#AghaeePE13"},"keyword":["dblp"],"downloads":0},"search_terms":["temperature","gradient","based","test","scheduling","stacked","ics","aghaee","peng","eles"],"keywords":["dblp"],"authorIDs":[],"dataSources":["psAZ6PHwL3HTwJ9Q9"]}