Preventing Scan Attack through Test Response Encryption. Ahlawat, S., Tudu, J. T., Gaur, M. S., Fujita, M., & Singh, V. In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019, pages 1–6, 2019.
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Paper doi bibtex
Paper doi bibtex @inproceedings{DBLP:conf/dft/AhlawatTGFS19,
author = {Satyadev Ahlawat and
Jaynarayan T. Tudu and
Manoj Singh Gaur and
Masahiro Fujita and
Virendra Singh},
title = {Preventing Scan Attack through Test Response Encryption},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
year = {2019},
crossref = {DBLP:conf/dft/2019},
url = {https://doi.org/10.1109/DFT.2019.8875355},
doi = {10.1109/DFT.2019.8875355},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/AhlawatTGFS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}Downloads: 0
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Tudu and\n Manoj Singh Gaur and\n Masahiro Fujita and\n Virendra Singh},\n title = {Preventing Scan Attack through Test Response Encryption},\n booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance\n in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,\n October 2-4, 2019},\n pages = {1--6},\n year = {2019},\n crossref = {DBLP:conf/dft/2019},\n url = {https://doi.org/10.1109/DFT.2019.8875355},\n doi = {10.1109/DFT.2019.8875355},\n timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},\n biburl = {https://dblp.org/rec/conf/dft/AhlawatTGFS19.bib},\n bibsource = {dblp computer science bibliography, https://dblp.org}\n}\n\n","author_short":["Ahlawat, S.","Tudu, J. T.","Gaur, M. 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