Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation. Ahmadi, A., Huang, K., Natarajan, S., Jr., Carulli, J. M., & Makris, Y. In ITC, pages 1-10, 2014. IEEE Computer Society.
Link
Paper bibtex @inproceedings{ conf/itc/AhmadiHNCM14,
added-at = {2015-08-26T00:00:00.000+0200},
author = {Ahmadi, Ali and Huang, Ke and Natarajan, Suriyaprakash and Jr., John M. Carulli and Makris, Yiorgos},
biburl = {http://www.bibsonomy.org/bibtex/21f40891299a916342b2b343fffc9a75d/dblp},
booktitle = {ITC},
crossref = {conf/itc/2014},
ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035325},
interhash = {4eca81c6997aab94f92ed1541ff6c14c},
intrahash = {1f40891299a916342b2b343fffc9a75d},
isbn = {978-1-4799-4722-5},
keywords = {dblp},
pages = {1-10},
publisher = {IEEE Computer Society},
title = {Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2014.html#AhmadiHNCM14},
year = {2014}
}
Downloads: 0
{"_id":"nHnt9d8aXcDT7uRDh","bibbaseid":"ahmadi-huang-natarajan-jr-carulli-makris-spatiotemporalwaferlevelcorrelationmodelingwithprogressivesamplingapathwaytohvmyieldestimation-2014","downloads":0,"creationDate":"2015-09-08T15:38:34.366Z","title":"Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation.","author_short":["Ahmadi, A.","Huang, K.","Natarajan, S.","Jr.","Carulli, J.<nbsp>M.","Makris, Y."],"year":2014,"bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bib/author/john?items=1000","bibdata":{"added-at":"2015-08-26T00:00:00.000+0200","author":["Ahmadi, Ali","Huang, Ke","Natarajan, Suriyaprakash","Jr.","Carulli, John M.","Makris, Yiorgos"],"author_short":["Ahmadi, A.","Huang, K.","Natarajan, S.","Jr.","Carulli, J.<nbsp>M.","Makris, Y."],"bibtex":"@inproceedings{ conf/itc/AhmadiHNCM14,\n added-at = {2015-08-26T00:00:00.000+0200},\n author = {Ahmadi, Ali and Huang, Ke and Natarajan, Suriyaprakash and Jr., John M. Carulli and Makris, Yiorgos},\n biburl = {http://www.bibsonomy.org/bibtex/21f40891299a916342b2b343fffc9a75d/dblp},\n booktitle = {ITC},\n crossref = {conf/itc/2014},\n ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035325},\n interhash = {4eca81c6997aab94f92ed1541ff6c14c},\n intrahash = {1f40891299a916342b2b343fffc9a75d},\n isbn = {978-1-4799-4722-5},\n keywords = {dblp},\n pages = {1-10},\n publisher = {IEEE Computer Society},\n title = {Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation.},\n url = {http://dblp.uni-trier.de/db/conf/itc/itc2014.html#AhmadiHNCM14},\n year = {2014}\n}","bibtype":"inproceedings","biburl":"http://www.bibsonomy.org/bibtex/21f40891299a916342b2b343fffc9a75d/dblp","booktitle":"ITC","crossref":"conf/itc/2014","ee":"http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035325","id":"conf/itc/AhmadiHNCM14","interhash":"4eca81c6997aab94f92ed1541ff6c14c","intrahash":"1f40891299a916342b2b343fffc9a75d","isbn":"978-1-4799-4722-5","key":"conf/itc/AhmadiHNCM14","keywords":"dblp","pages":"1-10","publisher":"IEEE Computer Society","title":"Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation.","type":"inproceedings","url":"http://dblp.uni-trier.de/db/conf/itc/itc2014.html#AhmadiHNCM14","year":"2014","bibbaseid":"ahmadi-huang-natarajan-jr-carulli-makris-spatiotemporalwaferlevelcorrelationmodelingwithprogressivesamplingapathwaytohvmyieldestimation-2014","role":"author","urls":{"Link":"http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035325","Paper":"http://dblp.uni-trier.de/db/conf/itc/itc2014.html#AhmadiHNCM14"},"keyword":["dblp"],"downloads":0},"search_terms":["spatio","temporal","wafer","level","correlation","modeling","progressive","sampling","pathway","hvm","yield","estimation","ahmadi","huang","natarajan","jr.","carulli","makris"],"keywords":["dblp"],"authorIDs":[],"dataSources":["e3DPfiLXyfZxic3k2"]}