Reachability analysis of nonlinear analog circuits through iterative reachable set reduction. Ahmadyan, S. N. & Vasudevan, S. In Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013, pages 1436–1441, 2013. EDA Consortium San Jose, CA, USA / ACM DL.
Reachability analysis of nonlinear analog circuits through iterative reachable set reduction [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/date/AhmadyanV13,
  author    = {Seyed Nematollah Ahmadyan and
               Shobha Vasudevan},
  editor    = {Enrico Macii},
  title     = {Reachability analysis of nonlinear analog circuits through iterative
               reachable set reduction},
  booktitle = {Design, Automation and Test in Europe, {DATE} 13, Grenoble, France,
               March 18-22, 2013},
  pages     = {1436--1441},
  publisher = {{EDA} Consortium San Jose, CA, {USA} / {ACM} {DL}},
  year      = {2013},
  url       = {https://doi.org/10.7873/DATE.2013.293},
  doi       = {10.7873/DATE.2013.293},
  timestamp = {Tue, 23 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/date/AhmadyanV13.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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