A comprehensive analysis of Auger generation impacted planar Tunnel FETs. Ahmed, S. Z., Truesdell, D. S., Tan, Y., Calhoun, B. H., & Ghosh, A. W. Solid-state electronics, 2020.
A comprehensive analysis of Auger generation impacted planar Tunnel FETs [link]Paper  bibtex   
@article{643,
  author = {Sheikh Z. Ahmed and Daniel S. Truesdell and Yaohua Tan and Benton H. Calhoun and Avik W. Ghosh},
  title = {A comprehensive analysis of Auger generation impacted planar Tunnel FETs},
  year = {2020},
  journal = {Solid-state electronics},
  url = {https://doi.org/10.1016/j.sse.2020.107782}
}

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