A comprehensive analysis of Auger generation impacted planar Tunnel FETs. Ahmed, S. Z., Truesdell, D. S., Tan, Y., Calhoun, B. H., & Ghosh, A. W. Solid-state electronics, 2020. Paper bibtex @article{643,
author = {Sheikh Z. Ahmed and Daniel S. Truesdell and Yaohua Tan and Benton H. Calhoun and Avik W. Ghosh},
title = {A comprehensive analysis of Auger generation impacted planar Tunnel FETs},
year = {2020},
journal = {Solid-state electronics},
url = {https://doi.org/10.1016/j.sse.2020.107782}
}
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