Sample complexity of salient feature identification for sparse signal processing. Aksoylar, C., Atia, G. K., & Saligrama, V. In IEEE Statistical Signal Processing Workshop, SSP 2012, Ann Arbor, MI, USA, August 5-8, 2012, pages 329–332, 2012. IEEE.
Sample complexity of salient feature identification for sparse signal processing [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/ssp/AksoylarAS12,
  author       = {Cem Aksoylar and
                  George K. Atia and
                  Venkatesh Saligrama},
  title        = {Sample complexity of salient feature identification for sparse signal
                  processing},
  booktitle    = {{IEEE} Statistical Signal Processing Workshop, {SSP} 2012, Ann Arbor,
                  MI, USA, August 5-8, 2012},
  pages        = {329--332},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/SSP.2012.6319695},
  doi          = {10.1109/SSP.2012.6319695},
  timestamp    = {Sat, 05 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ssp/AksoylarAS12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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