@article{alam2018apple,
  title={Apple Defects Detection Using Principal Component Features of Multispectral Reflectance Imaging},
  author={Alam, Md and Pineda, Israel and Lim, Jong Guk and Gwun, Oubong and others},
  journal={Science of Advanced Materials},
  volume={10},
  number={7},
  pages={1051--1062},
  year={2018},
  publisher={American Scientific Publishers}
}

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