Apple Defects Detection Using Principal Component Features of Multispectral Reflectance Imaging. Alam, M., Pineda, I., Lim, J. G., Gwun, O., & others Science of Advanced Materials, 10(7):1051–1062, American Scientific Publishers, 2018. bibtex @article{alam2018apple,
title={Apple Defects Detection Using Principal Component Features of Multispectral Reflectance Imaging},
author={Alam, Md and Pineda, Israel and Lim, Jong Guk and Gwun, Oubong and others},
journal={Science of Advanced Materials},
volume={10},
number={7},
pages={1051--1062},
year={2018},
publisher={American Scientific Publishers}
}
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