Development of a Life Model for Light Emitting Diodes Stressed by Forward Current. Albertini, A., Mazzanti, G., Peretto, L., & Tinarelli, R. IEEE Transactions on Reliability, 63(2):523--533, June, 2014.
Development of a Life Model for Light Emitting Diodes Stressed by Forward Current [link]Paper  doi  bibtex   
@article{albertini_development_2014,
	title = {Development of a {Life} {Model} for {Light} {Emitting} {Diodes} {Stressed} by {Forward} {Current}},
	volume = {63},
	issn = {0018-9529, 1558-1721},
	url = {http://ieeexplore.ieee.org/document/6807523/},
	doi = {10.1109/TR.2014.2315926},
	number = {2},
	urldate = {2016-10-20TZ},
	journal = {IEEE Transactions on Reliability},
	author = {Albertini, Andrea and Mazzanti, Giovanni and Peretto, Lorenzo and Tinarelli, Roberto},
	month = jun,
	year = {2014},
	pages = {523--533}
}

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