Local Difference of Gaussian Binary Pattern: Robust Features for Face Sketch Recognition. Alex, A. T., Asari, V. K., & Mathew, A. In SMC, pages 1211-1216, 2013. IEEE.
Local Difference of Gaussian Binary Pattern: Robust Features for Face Sketch Recognition. [link]Link  Local Difference of Gaussian Binary Pattern: Robust Features for Face Sketch Recognition. [link]Paper  bibtex   
@inproceedings{conf/smc/AlexAM13,
  author = {Alex, Ann Theja and Asari, Vijayan K. and Mathew, Alex},
  booktitle = {SMC},
  crossref = {conf/smc/2013},
  ee = {http://dx.doi.org/10.1109/SMC.2013.210},
  interhash = {5d9b9f62ad47b13bfc853c2bb8ef5d1d},
  intrahash = {0a6e4f7c2fdfc13f4b4e7f817c6850d5},
  isbn = {978-0-7695-5154-8},
  pages = {1211-1216},
  publisher = {IEEE},
  title = {Local Difference of Gaussian Binary Pattern: Robust Features for Face Sketch Recognition.},
  url = {http://dblp.uni-trier.de/db/conf/smc/smc2013.html#AlexAM13},
  year = 2013
}

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