Full orientation invariance and improved feature selectivity of 3D SIFT with application to medical image analysis. Allaire, S., Kim, J. J., Breen, S. L., Jaffray, D. A., & Pekar, V. In CVPR Workshops, pages 1-8, 2008. IEEE.
Full orientation invariance and improved feature selectivity of 3D SIFT with application to medical image analysis. [link]Link  Full orientation invariance and improved feature selectivity of 3D SIFT with application to medical image analysis. [link]Paper  bibtex   
@inproceedings{conf/cvpr/AllaireKBJP08,
  added-at = {2015-12-02T00:00:00.000+0100},
  author = {Allaire, Stéphane and Kim, John J. and Breen, Stephen L. and Jaffray, David A. and Pekar, Vladimir},
  biburl = {http://www.bibsonomy.org/bibtex/24d3ae03fa4ec17edc25823c87c96c633/dblp},
  booktitle = {CVPR Workshops},
  crossref = {conf/cvpr/2008w},
  ee = {http://doi.ieeecomputersociety.org/10.1109/CVPRW.2008.4563023},
  interhash = {ab0955c4d051308682b3c31a823a85ec},
  intrahash = {4d3ae03fa4ec17edc25823c87c96c633},
  isbn = {978-1-4244-2340-8},
  keywords = {dblp},
  pages = {1-8},
  publisher = {IEEE},
  timestamp = {2015-12-03T11:36:29.000+0100},
  title = {Full orientation invariance and improved feature selectivity of 3D SIFT with application to medical image analysis.},
  url = {http://dblp.uni-trier.de/db/conf/cvpr/cvprw2008.html#AllaireKBJP08},
  year = 2008
}

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