Uncovering product line variability from early requirement documents. Almentero, E., Cirilo, E., de Lucena, C. J. P., do Prado Leite, J. C. S., & de Castro Leal, A. L. In Third IEEE International Workshop on Requirements Patterns, RePa 2013, Rio de Janeiro, Brazil, July 16, 2013, pages 35--40, 2013.
Uncovering product line variability from early requirement documents [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/re/AlmenteroCLLL13,
  author    = {Eduardo Almentero and
               Elder Cirilo and
               Carlos Jos{\'{e}} Pereira de Lucena and
               Julio Cesar Sampaio do Prado Leite and
               Andr{\'{e}} Luiz de Castro Leal},
  title     = {Uncovering product line variability from early requirement documents},
  booktitle = {Third {IEEE} International Workshop on Requirements Patterns, RePa
               2013, Rio de Janeiro, Brazil, July 16, 2013},
  pages     = {35--40},
  year      = {2013},
  crossref  = {DBLP:conf/re/2013repa},
  url       = {https://doi.org/10.1109/RePa.2013.6602670},
  doi       = {10.1109/RePa.2013.6602670},
  timestamp = {Mon, 22 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/re/AlmenteroCLLL13},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}

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