A statistical simulation method for reliability analysis of SRAM core-cells. Alves Fonseca, R., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Virazel, A., & Badereddine, N. In Proceedings of Design Automation Conference (DAC), pages 853-856, 2010.
Paper bibtex @inproceedings{ dblp2527803,
title = {A statistical simulation method for reliability analysis of SRAM core-cells},
author = {Renan Alves Fonseca and Luigi Dilillo and Alberto Bosio and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Nabil Badereddine},
author_short = {Alves Fonseca, R. and Dilillo, L. and Bosio, A. and Girard, P. and Pravossoudovitch, S. and Virazel, A. and Badereddine, N.},
bibtype = {inproceedings},
type = {inproceedings},
year = {2010},
key = {dblp2527803},
id = {dblp2527803},
biburl = {http://www.dblp.org/rec/bibtex/conf/dac/FonsecaDBGPVB10},
url = {http://doi.acm.org/10.1145/1837274.1837487},
conference = {DAC},
pages = {853-856},
text = {DAC 2010:853-856},
booktitle = {Proceedings of Design Automation Conference (DAC)}
}
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