A Worst-Case-Aware Design Methodology for Noise-Tolerant Oscillator-Based True Random Number Generator With Stochastic Behavior Modeling. Amaki, T., Hashimoto, M., Mitsuyama, Y., & Onoye, T. IEEE Transactions on Information Forensics and Security, 8(8):1331–1342, August, 2013. doi abstract bibtex This paper presents a worst-case-aware design methodology for an oscillator-based true random number generator (TRNG) that produces highly random bit streams even under deterministic noise. We propose a stochastic behavior model to efficiently determine design parameters, and identify a class of deterministic noise under which the randomness gets the worst. They can be used to directly estimate the worst χ value of a poker test under deterministic noise without generating bit streams, which enables efficient exploration of design space and guarantees sufficient randomness in a hostile environment. The proposed model is validated by measuring prototype TRNGs fabricated with a 65-nm CMOS process.
@article{amaki_worst-case-aware_2013,
title = {A {Worst}-{Case}-{Aware} {Design} {Methodology} for {Noise}-{Tolerant} {Oscillator}-{Based} {True} {Random} {Number} {Generator} {With} {Stochastic} {Behavior} {Modeling}},
volume = {8},
issn = {1556-6013},
doi = {10.1109/TIFS.2013.2271423},
abstract = {This paper presents a worst-case-aware design methodology for an oscillator-based true random number generator (TRNG) that produces highly random bit streams even under deterministic noise. We propose a stochastic behavior model to efficiently determine design parameters, and identify a class of deterministic noise under which the randomness gets the worst. They can be used to directly estimate the worst χ value of a poker test under deterministic noise without generating bit streams, which enables efficient exploration of design space and guarantees sufficient randomness in a hostile environment. The proposed model is validated by measuring prototype TRNGs fabricated with a 65-nm CMOS process.},
number = {8},
journal = {IEEE Transactions on Information Forensics and Security},
author = {Amaki, T. and Hashimoto, M. and Mitsuyama, Y. and Onoye, T.},
month = aug,
year = {2013},
pages = {1331--1342}
}
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