A process and temperature tolerant oscillator-based true random number generator with dynamic 0/1 bias correction. Amaki, T., Hashimoto, M., & Onoye, T. In Solid-State Circuits Conference (A-SSCC), 2013 IEEE Asian, pages 133–136, November, 2013. doi abstract bibtex This paper presents an oscillator-based true random number generator (TRNG) that dynamically unbiases 0/1 probability. The proposed TRNG automatically adjusts the duty cycle of a fast oscillator to 50 %, and generates unbiased random numbers tolerating process variation and dynamic temperature fluctuation. A prototype chip of the proposed TRNG was fabricated with a 65 nm CMOS process. Measurement results show that the developed duty cycle monitor obtained the probability of `1' 4,100 times faster than the conventional output bit observation, or estimated the probability with 70 times higher accuracy. The proposed TRNG adjusted the probability of `1' to within 50±0.07 % in five chips in the temperature range of 0 °C to 75 °C. Consequently, the proposed TRNG passed the NIST and DIEHARD tests at 7.5 Mbps with 6,670 μm2 area.
@inproceedings{amaki_process_2013,
title = {A process and temperature tolerant oscillator-based true random number generator with dynamic 0/1 bias correction},
doi = {10.1109/ASSCC.2013.6691000},
abstract = {This paper presents an oscillator-based true random number generator (TRNG) that dynamically unbiases 0/1 probability. The proposed TRNG automatically adjusts the duty cycle of a fast oscillator to 50 \%, and generates unbiased random numbers tolerating process variation and dynamic temperature fluctuation. A prototype chip of the proposed TRNG was fabricated with a 65 nm CMOS process. Measurement results show that the developed duty cycle monitor obtained the probability of `1' 4,100 times faster than the conventional output bit observation, or estimated the probability with 70 times higher accuracy. The proposed TRNG adjusted the probability of `1' to within 50±0.07 \% in five chips in the temperature range of 0 °C to 75 °C. Consequently, the proposed TRNG passed the NIST and DIEHARD tests at 7.5 Mbps with 6,670 μm2 area.},
booktitle = {Solid-{State} {Circuits} {Conference} ({A}-{SSCC}), 2013 {IEEE} {Asian}},
author = {Amaki, T. and Hashimoto, M. and Onoye, T.},
month = nov,
year = {2013},
pages = {133--136}
}
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{"_id":"9QdmwCqDav9gDiLFs","bibbaseid":"amaki-hashimoto-onoye-aprocessandtemperaturetolerantoscillatorbasedtruerandomnumbergeneratorwithdynamic01biascorrection-2013","authorIDs":[],"author_short":["Amaki, T.","Hashimoto, M.","Onoye, T."],"bibdata":{"bibtype":"inproceedings","type":"inproceedings","title":"A process and temperature tolerant oscillator-based true random number generator with dynamic 0/1 bias correction","doi":"10.1109/ASSCC.2013.6691000","abstract":"This paper presents an oscillator-based true random number generator (TRNG) that dynamically unbiases 0/1 probability. The proposed TRNG automatically adjusts the duty cycle of a fast oscillator to 50 %, and generates unbiased random numbers tolerating process variation and dynamic temperature fluctuation. A prototype chip of the proposed TRNG was fabricated with a 65 nm CMOS process. Measurement results show that the developed duty cycle monitor obtained the probability of `1' 4,100 times faster than the conventional output bit observation, or estimated the probability with 70 times higher accuracy. The proposed TRNG adjusted the probability of `1' to within 50±0.07 % in five chips in the temperature range of 0 °C to 75 °C. Consequently, the proposed TRNG passed the NIST and DIEHARD tests at 7.5 Mbps with 6,670 μm2 area.","booktitle":"Solid-State Circuits Conference (A-SSCC), 2013 IEEE Asian","author":[{"propositions":[],"lastnames":["Amaki"],"firstnames":["T."],"suffixes":[]},{"propositions":[],"lastnames":["Hashimoto"],"firstnames":["M."],"suffixes":[]},{"propositions":[],"lastnames":["Onoye"],"firstnames":["T."],"suffixes":[]}],"month":"November","year":"2013","pages":"133–136","bibtex":"@inproceedings{amaki_process_2013,\n\ttitle = {A process and temperature tolerant oscillator-based true random number generator with dynamic 0/1 bias correction},\n\tdoi = {10.1109/ASSCC.2013.6691000},\n\tabstract = {This paper presents an oscillator-based true random number generator (TRNG) that dynamically unbiases 0/1 probability. The proposed TRNG automatically adjusts the duty cycle of a fast oscillator to 50 \\%, and generates unbiased random numbers tolerating process variation and dynamic temperature fluctuation. A prototype chip of the proposed TRNG was fabricated with a 65 nm CMOS process. Measurement results show that the developed duty cycle monitor obtained the probability of `1' 4,100 times faster than the conventional output bit observation, or estimated the probability with 70 times higher accuracy. The proposed TRNG adjusted the probability of `1' to within 50±0.07 \\% in five chips in the temperature range of 0 °C to 75 °C. Consequently, the proposed TRNG passed the NIST and DIEHARD tests at 7.5 Mbps with 6,670 μm2 area.},\n\tbooktitle = {Solid-{State} {Circuits} {Conference} ({A}-{SSCC}), 2013 {IEEE} {Asian}},\n\tauthor = {Amaki, T. and Hashimoto, M. and Onoye, T.},\n\tmonth = nov,\n\tyear = {2013},\n\tpages = {133--136}\n}\n\n","author_short":["Amaki, T.","Hashimoto, M.","Onoye, T."],"key":"amaki_process_2013","id":"amaki_process_2013","bibbaseid":"amaki-hashimoto-onoye-aprocessandtemperaturetolerantoscillatorbasedtruerandomnumbergeneratorwithdynamic01biascorrection-2013","role":"author","urls":{},"downloads":0},"bibtype":"inproceedings","biburl":"https://bibbase.org/zotero/ky25","creationDate":"2019-05-11T17:47:04.668Z","downloads":0,"keywords":[],"search_terms":["process","temperature","tolerant","oscillator","based","true","random","number","generator","dynamic","bias","correction","amaki","hashimoto","onoye"],"title":"A process and temperature tolerant oscillator-based true random number generator with dynamic 0/1 bias correction","year":2013,"dataSources":["XxiQtwZYfozhQmvGR"]}