Detailed Comparison of Dependability Analyses Performed at RT and Gate Levels. Ammari, A., Leveugle, R., Sonza Reorda, M., & Violante, M. In Proceedings of Dependability and Fault Tolerance (DFT), pages 336-343, 2003.
Detailed Comparison of Dependability Analyses Performed at RT and Gate Levels [link]Paper  bibtex   
@inproceedings{ dblp3750986,
  title = {Detailed Comparison of Dependability Analyses Performed at RT and Gate Levels},
  author = {Abdelaziz Ammari and Régis Leveugle and Matteo Sonza Reorda and Massimo Violante},
  author_short = {Ammari, A. and Leveugle, R. and Sonza Reorda, M. and Violante, M.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2003},
  key = {dblp3750986},
  id = {dblp3750986},
  biburl = {http://www.dblp.org/rec/bibtex/conf/dft/AmmariLRV03},
  url = {http://dx.doi.org/10.1109/DFTVS.2003.1250129},
  conference = {DFT},
  pages = {336-343},
  text = {DFT 2003:336-343},
  booktitle = {Proceedings of Dependability and Fault Tolerance (DFT)}
}

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