Determining the test sources/sinks for NoC TAMs. Amory, A. M., Moreno, E. I., Moraes, F. G., & Lubaszewski, M. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2013, Natal, Brazil, August 5-7, 2013, pages 8–13, 2013.
Paper doi bibtex @inproceedings{DBLP:conf/isvlsi/AmoryMML13,
author = {Alexandre M. Amory and
Edson I. Moreno and
Fernando Gehm Moraes and
Marcelo Lubaszewski},
title = {Determining the test sources/sinks for NoC TAMs},
booktitle = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2013, Natal,
Brazil, August 5-7, 2013},
pages = {8--13},
year = {2013},
crossref = {DBLP:conf/isvlsi/2013},
url = {http://dx.doi.org/10.1109/ISVLSI.2013.6654615},
doi = {10.1109/ISVLSI.2013.6654615},
timestamp = {Tue, 26 May 2015 18:41:04 +0200},
biburl = {http://dblp.uni-trier.de/rec/bib/conf/isvlsi/AmoryMML13},
bibsource = {dblp computer science bibliography, http://dblp.org},
keywords = {noc,testing}
}
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