Determining the test sources/sinks for NoC TAMs. Amory, A. M., Moreno, E. I., Moraes, F., & Lubaszewski, M. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2013, Natal, Brazil, August 5-7, 2013, pages 8–13, 2013. IEEE Computer Socity.
Determining the test sources/sinks for NoC TAMs [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/isvlsi/AmoryMML13,
  author    = {Alexandre M. Amory and
               Edson I. Moreno and
               Fernando Moraes and
               Marcelo Lubaszewski},
  title     = {Determining the test sources/sinks for NoC TAMs},
  booktitle = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2013, Natal,
               Brazil, August 5-7, 2013},
  pages     = {8--13},
  publisher = {{IEEE} Computer Socity},
  year      = {2013},
  url       = {https://doi.org/10.1109/ISVLSI.2013.6654615},
  doi       = {10.1109/ISVLSI.2013.6654615},
  timestamp = {Tue, 10 Mar 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/isvlsi/AmoryMML13.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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