Determining the test sources/sinks for NoC TAMs. Amory, A. M., Moreno, E. I., Moraes, F. G., & Lubaszewski, M. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2013, Natal, Brazil, August 5-7, 2013, pages 8–13, 2013.
Determining the test sources/sinks for NoC TAMs [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/isvlsi/AmoryMML13,
  author    = {Alexandre M. Amory and
               Edson I. Moreno and
               Fernando Gehm Moraes and
               Marcelo Lubaszewski},
  title     = {Determining the test sources/sinks for NoC TAMs},
  booktitle = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2013, Natal,
               Brazil, August 5-7, 2013},
  pages     = {8--13},
  year      = {2013},
  crossref  = {DBLP:conf/isvlsi/2013},
  url       = {http://dx.doi.org/10.1109/ISVLSI.2013.6654615},
  doi       = {10.1109/ISVLSI.2013.6654615},
  timestamp = {Tue, 26 May 2015 18:41:04 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/isvlsi/AmoryMML13},
  bibsource = {dblp computer science bibliography, http://dblp.org},
  keywords  = {noc,testing}
}

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