Determining the test sources/sinks for NoC TAMs. Amory, A. M., Moreno, E. I., Moraes, F., & Lubaszewski, M. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2013, Natal, Brazil, August 5-7, 2013, pages 8–13, 2013. IEEE Computer Socity.
Determining the test sources/sinks for NoC TAMs [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/isvlsi/AmoryMML13,
  author       = {Alexandre M. Amory and
                  Edson I. Moreno and
                  Fernando Moraes and
                  Marcelo Lubaszewski},
  title        = {Determining the test sources/sinks for NoC TAMs},
  booktitle    = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2013, Natal,
                  Brazil, August 5-7, 2013},
  pages        = {8--13},
  publisher    = {{IEEE} Computer Socity},
  year         = {2013},
  url          = {https://doi.org/10.1109/ISVLSI.2013.6654615},
  doi          = {10.1109/ISVLSI.2013.6654615},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/isvlsi/AmoryMML13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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