Determining the test sources/sinks for NoC TAMs. Amory, A. M., Moreno, E. I., Moraes, F., & Lubaszewski, M. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2013, Natal, Brazil, August 5-7, 2013, pages 8–13, 2013. IEEE Computer Socity. Paper doi bibtex @inproceedings{DBLP:conf/isvlsi/AmoryMML13,
author = {Alexandre M. Amory and
Edson I. Moreno and
Fernando Moraes and
Marcelo Lubaszewski},
title = {Determining the test sources/sinks for NoC TAMs},
booktitle = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2013, Natal,
Brazil, August 5-7, 2013},
pages = {8--13},
publisher = {{IEEE} Computer Socity},
year = {2013},
url = {https://doi.org/10.1109/ISVLSI.2013.6654615},
doi = {10.1109/ISVLSI.2013.6654615},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isvlsi/AmoryMML13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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