An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging. Anderson, S., Birkelandaq, C., Anstis, G., & Cockayne, D. Ultramicroscopy, 69:83–103, 1997.
bibtex   
@article{s.c._anderson_approach_1997,
	title = {An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging},
	volume = {69},
	journal = {Ultramicroscopy},
	author = {S.C. Anderson and C.R. Birkelandaq and G.R. Anstis and D.J.H. Cockayne},
	year = {1997},
	pages = {83--103},
}

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