Test and Reliability in Approximate Computing. Anghel, L., Benabdenbi, M., Bosio, A., Traiola, M., & Vatajelu, E. I. Journal of Electronic Testing, 34(4):375–387, Aug, 2018. doi bibtex @article{Anghel2018,
author="Lorena Anghel and Mounir Benabdenbi and Alberto Bosio and Marcello Traiola and Elena Ioana Vatajelu",
title="Test and Reliability in Approximate Computing",
journal="Journal of Electronic Testing",
year="2018",
month="Aug",
day="01",
volume="34",
number="4",
pages="375--387",
issn="1573-0727",
doi="10.1007/s10836-018-5734-9"
}
Downloads: 0
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