Raman and X-ray diffraction study of (Ba,Sr)TiO3/(Bi,Nd)FeO3 multilayer heterostructures. Anokhin, A. S., Bunina, O. A., Golovko, Y. I., Mukhortov, V. M., Yuzyuk, Y. I., & Simon, P. Thin Solid Films, 545:267–271, October, 2013.
Raman and X-ray diffraction study of (Ba,Sr)TiO3/(Bi,Nd)FeO3 multilayer heterostructures [link]Paper  doi  abstract   bibtex   
We report synthesis, X-ray diffraction (XRD) and Raman scattering characterisation of epitaxial heterostructures containing alternating (Bi0.98Nd0.02)FeO3 (BNFO) and (Ba0.8Sr0.2TiO3) (BST) layers deposited on (100) MgO substrates. A significant shift of the BST soft mode and partial depolarisation in the Raman spectra of multilayer heterostructures caused by epitaxial strains were observed. Satellite peaks typical for superlattices were observed in the XRD patterns of multilayer heterostructures with layer thicknesses below 30nm. Raman spectra of the BNFO/BST superlattice with a modulation period of 10nm revealed hardening of the soft mode and a dominating symmetric-stretching mode at 705cm−1 due to distortion in FeO6 octahedra enforced by the epitaxial strain in the superlattice.
@article{anokhin_raman_2013,
	title = {Raman and {X}-ray diffraction study of ({Ba},{Sr}){TiO3}/({Bi},{Nd}){FeO3} multilayer heterostructures},
	volume = {545},
	issn = {0040-6090},
	url = {https://www.sciencedirect.com/science/article/pii/S0040609013013564},
	doi = {10.1016/j.tsf.2013.08.057},
	abstract = {We report synthesis, X-ray diffraction (XRD) and Raman scattering characterisation of epitaxial heterostructures containing alternating (Bi0.98Nd0.02)FeO3 (BNFO) and (Ba0.8Sr0.2TiO3) (BST) layers deposited on (100) MgO substrates. A significant shift of the BST soft mode and partial depolarisation in the Raman spectra of multilayer heterostructures caused by epitaxial strains were observed. Satellite peaks typical for superlattices were observed in the XRD patterns of multilayer heterostructures with layer thicknesses below 30nm. Raman spectra of the BNFO/BST superlattice with a modulation period of 10nm revealed hardening of the soft mode and a dominating symmetric-stretching mode at 705cm−1 due to distortion in FeO6 octahedra enforced by the epitaxial strain in the superlattice.},
	urldate = {2023-11-11},
	journal = {Thin Solid Films},
	author = {Anokhin, A. S. and Bunina, O. A. and Golovko, Yu I. and Mukhortov, V. M. and Yuzyuk, Yu I. and Simon, P.},
	month = oct,
	year = {2013},
	keywords = {Multiferroics, Raman spectroscopy, Sputtering, Thin films, X-ray diffraction superlattices},
	pages = {267--271},
}

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