Def Stan 00-42 Part 1 Reliability and Maintainability Assurance Activity Part 1: One-Shot Device/Systems. Technical Report Def Stan 00-42 Part 1 Issue 2, UK Defence Standardization, 2008. ![Def Stan 00-42 Part 1 Reliability and Maintainability Assurance Activity Part 1: One-Shot Device/Systems [pdf]](https://bibbase.org/img/filetypes/pdf.svg "pdf")
Paper abstract bibtex One-shot devices and one-shot systems, either electronic, mechanical or structural, by definition, cannot be fully tested prior to use because testing in the full mode of operation usually results in their total or partial destruction; or an irreversibility of a discrete part. One-shot devices for military applications are, conventionally, stored for long periods, often in excess of 10 or 20 years and, during this time, may be transported between and stored in different climatic conditions before being finally expended in the manner for which they are designed. Reliability can, therefore often only be demonstrated statistically by sampling some of the items and fully testing these. This leads to: a need to identify discrete parts of production by batch or lot; a requirement to apply sampling knowledge; and the necessity to apply viable probability theory to deduce correct statistical inferences. The requirements of Def Stan 00-40, Part 1 in whole or tailored, can be made contractual during the design and development stages of the acquisition cycle however it will need to be conducted with a detailed understanding of the solution and it’s associated R&M specification
@techreport{noauthor_def_2008-1,
type = {Standard},
title = {Def {Stan} 00-42 {Part} 1 {Reliability} and {Maintainability} {Assurance} {Activity} {Part} 1: {One}-{Shot} {Device}/{Systems}},
shorttitle = {Def {Stan} 00-42 {Part} 1 {Issue} 2},
url = {http://www.acuitas.com/sites/default/files/standards/DStan00_42P1I2_One_Shot_Device.pdf},
abstract = {One-shot devices and one-shot systems, either electronic, mechanical or structural, by definition, cannot be fully tested prior to use because testing in the full mode of operation usually results in their total or partial destruction; or an irreversibility of a discrete part. One-shot devices for military applications are,
conventionally, stored for long periods, often in excess of 10 or 20 years and, during this time, may be transported between and stored in different climatic conditions before being finally expended in the manner for which they are designed.
Reliability can, therefore often only be demonstrated statistically by sampling some of the items and fully testing these. This leads to: a need to identify discrete parts of production by batch or lot; a requirement to apply sampling knowledge; and the necessity to apply viable probability theory to deduce correct statistical
inferences. The requirements of Def Stan 00-40, Part 1 in whole or tailored, can be made contractual during the design and development stages of the acquisition cycle however it will need to be conducted with a detailed understanding of the solution and it’s associated R\&M specification},
number = {Def Stan 00-42 Part 1 Issue 2},
institution = {UK Defence Standardization},
year = {2008},
keywords = {Apportionment, Assurance, Def Stan, FMEA, FMECA, FTA, Modelling, One-Shot, Predictions, RAM Case, Testability, UK}
}
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