IEEE Xplore Document - Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests.
IEEE Xplore Document - Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests [link]Paper  bibtex   
@misc{_ieee_????-3,
	title = {{IEEE} {Xplore} {Document} - {Optical} {Degradation} {Mechanisms} of {Indium} {Gallium} {Nitride}-{Based} {White} {Light} {Emitting} {Diodes} by {High}-{Temperature} {Aging} {Tests}},
	url = {http://ieeexplore.ieee.org/document/7128415/},
	urldate = {2016-10-20TZ}
}

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