An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis. Ao, Y., Shi, Y., Zhang, W., & Li, Y. J. Electronic Testing (ET), 29(4):555-565, 2013.
An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis [link]Paper  bibtex   
@article{ dblp2144502,
  title = {An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis},
  author = {Yongcai Ao and Yibing Shi and Wei Zhang and Yanjun Li},
  author_short = {Ao, Y. and Shi, Y. and Zhang, W. and Li, Y.},
  bibtype = {article},
  type = {article},
  year = {2013},
  key = {dblp2144502},
  id = {dblp2144502},
  biburl = {http://www.dblp.org/rec/bibtex/journals/et/AoSZL13},
  url = {http://dx.doi.org/10.1007/s10836-013-5382-z},
  journal = {J. Electronic Testing (ET)},
  pages = {555-565},
  number = {4},
  volume = {29},
  text = {J. Electronic Testing (ET) 29(4):555-565 (2013)}
}

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