An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis. Ao, Y., Shi, Y., Zhang, W., & Li, Y. J. Electronic Testing (ET), 29(4):555-565, 2013.
Paper bibtex @article{ dblp2144502,
title = {An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis},
author = {Yongcai Ao and Yibing Shi and Wei Zhang and Yanjun Li},
author_short = {Ao, Y. and Shi, Y. and Zhang, W. and Li, Y.},
bibtype = {article},
type = {article},
year = {2013},
key = {dblp2144502},
id = {dblp2144502},
biburl = {http://www.dblp.org/rec/bibtex/journals/et/AoSZL13},
url = {http://dx.doi.org/10.1007/s10836-013-5382-z},
journal = {J. Electronic Testing (ET)},
pages = {555-565},
number = {4},
volume = {29},
text = {J. Electronic Testing (ET) 29(4):555-565 (2013)}
}
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