Ultrashort electron source accelerated under high voltage for electron microscopy and interferometry. Arbouet, A. & Houdellier, F. February 2013. Internationalbibtex @patent{ arbouet_ultrashort_2013,
address = {CNRS},
title = {Ultrashort electron source accelerated under high voltage for electron microscopy and interferometry},
number = {Extension international PCT/EP2013/053127},
author = {Arbouet, A. and Houdellier, F.},
month = {February},
year = {2013},
note = {International}
}
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