Ultrashort electron source accelerated under high voltage for electron microscopy and interferometry. Arbouet, A. & Houdellier, F. February 2013. International
bibtex   
@patent{ arbouet_ultrashort_2013,
  address = {CNRS},
  title = {Ultrashort electron source accelerated under high voltage for electron microscopy and interferometry},
  number = {Extension international PCT/EP2013/053127},
  author = {Arbouet, A. and Houdellier, F.},
  month = {February},
  year = {2013},
  note = {International}
}

Downloads: 0