A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise. Asokan, A., Todri-Sanial, A., Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., & Virazel, A. In Proceedings of IEEE Computer Society Annual Symposium on VLSI (ISVLSI), pages 226-231, 2014.
A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise [link]Paper  bibtex   
@inproceedings{ dblp1723192,
  title = {A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise},
  author = {Anu Asokan and Aida Todri-Sanial and Alberto Bosio and Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel},
  author_short = {Asokan, A. and Todri-Sanial, A. and Bosio, A. and Dilillo, L. and Girard, P. and Pravossoudovitch, S. and Virazel, A.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2014},
  key = {dblp1723192},
  id = {dblp1723192},
  biburl = {http://www.dblp.org/rec/bibtex/conf/isvlsi/AsokanTBDGPV14},
  url = {http://dx.doi.org/10.1109/ISVLSI.2014.42},
  conference = {ISVLSI},
  pages = {226-231},
  text = {ISVLSI 2014:226-231},
  booktitle = {Proceedings of IEEE Computer Society Annual Symposium on VLSI (ISVLSI)}
}

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