Multi-Loss Topology-Aware Deep Learning Network for Segmentation of Vessels in Microscopy Images. Attari, M., Nguyen, N. P., Palaniappan, K., & Bunyak, F. In 52nd IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2023, St. Louis, MO, USA, September 27-29, 2023, pages 1–7, 2023. IEEE. Paper doi bibtex @inproceedings{DBLP:conf/aipr/AttariNPB23,
author = {Minasadat Attari and
Nguyen P. Nguyen and
Kannappan Palaniappan and
Filiz Bunyak},
title = {Multi-Loss Topology-Aware Deep Learning Network for Segmentation of
Vessels in Microscopy Images},
booktitle = {52nd {IEEE} Applied Imagery Pattern Recognition Workshop, {AIPR} 2023,
St. Louis, MO, USA, September 27-29, 2023},
pages = {1--7},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/AIPR60534.2023.10440665},
doi = {10.1109/AIPR60534.2023.10440665},
timestamp = {Wed, 13 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aipr/AttariNPB23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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