Multi-Loss Topology-Aware Deep Learning Network for Segmentation of Vessels in Microscopy Images. Attari, M., Nguyen, N. P., Palaniappan, K., & Bunyak, F. In 52nd IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2023, St. Louis, MO, USA, September 27-29, 2023, pages 1–7, 2023. IEEE.
Multi-Loss Topology-Aware Deep Learning Network for Segmentation of Vessels in Microscopy Images [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/aipr/AttariNPB23,
  author       = {Minasadat Attari and
                  Nguyen P. Nguyen and
                  Kannappan Palaniappan and
                  Filiz Bunyak},
  title        = {Multi-Loss Topology-Aware Deep Learning Network for Segmentation of
                  Vessels in Microscopy Images},
  booktitle    = {52nd {IEEE} Applied Imagery Pattern Recognition Workshop, {AIPR} 2023,
                  St. Louis, MO, USA, September 27-29, 2023},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AIPR60534.2023.10440665},
  doi          = {10.1109/AIPR60534.2023.10440665},
  timestamp    = {Wed, 13 Mar 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/aipr/AttariNPB23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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