Pattern-Constrained Test Case Generation. Atzmüller, M., Baumeister, J., & Puppe, F. In Proceedings of the Twentieth International Florida Artificial Intelligence Research Society Conference, May 7-9, 2007, Key West, Florida, USA, pages 518-523, 2007.
bibtex   
@inproceedings{ DBLP:conf/flairs/AtzmullerBP07,
  author = {Martin Atzmüller and Joachim Baumeister and Frank Puppe},
  title = {Pattern-Constrained Test Case Generation},
  booktitle = {Proceedings of the Twentieth International Florida Artificial Intelligence Research Society Conference, May 7-9, 2007, Key West, Florida, USA},
  pages = {518-523},
  year = {2007}
}

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