@article{ dblp1700917,
  title = {A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs},
  author = {Joao Azevedo and Arnaud Virazel and Alberto Bosio and Luigi Dilillo and Patrick Girard and Aida Todri-Sanial and Jérémy Alvarez-Herault and Ken Mackay},
  author_short = {Azevedo, J. and Virazel, A. and Bosio, A. and Dilillo, L. and Girard, P. and Todri-Sanial, A. and Alvarez-Herault, J. and Mackay, K.},
  bibtype = {article},
  type = {article},
  year = {2014},
  key = {dblp1700917},
  id = {dblp1700917},
  biburl = {http://www.dblp.org/rec/bibtex/journals/tvlsi/AzevedoVBDGTAM14},
  url = {http://dx.doi.org/10.1109/TVLSI.2013.2294080},
  journal = {IEEE Trans. VLSI Syst. (TVLSI)},
  pages = {2326-2335},
  number = {11},
  volume = {22},
  text = {IEEE Trans. VLSI Syst. (TVLSI) 22(11):2326-2335 (2014)}
}

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