On the Worst-Case Side-Channel Security of ECC Point Randomization in Embedded Devices. Azouaoui, M., Durvaux, F., Poussier, R., Standaert, F., Papagiannopoulos, K., & Verneuil, V. In Bhargavan, K., Oswald, E., & Prabhakaran, M., editors, Progress in Cryptology - INDOCRYPT 2020 - 21st International Conference on Cryptology in India, Bangalore, India, December 13-16, 2020, Proceedings, volume 12578, of Lecture Notes in Computer Science, pages 205–227, 2020. Springer.
On the Worst-Case Side-Channel Security of ECC Point Randomization in Embedded Devices [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/indocrypt/AzouaouiDPSPV20,
  author    = {Melissa Azouaoui and
               Fran{\c{c}}ois Durvaux and
               Romain Poussier and
               Fran{\c{c}}ois{-}Xavier Standaert and
               Kostas Papagiannopoulos and
               Vincent Verneuil},
  editor    = {Karthikeyan Bhargavan and
               Elisabeth Oswald and
               Manoj Prabhakaran},
  title     = {On the Worst-Case Side-Channel Security of {ECC} Point Randomization
               in Embedded Devices},
  booktitle = {Progress in Cryptology - {INDOCRYPT} 2020 - 21st International Conference
               on Cryptology in India, Bangalore, India, December 13-16, 2020, Proceedings},
  series    = {Lecture Notes in Computer Science},
  volume    = {12578},
  pages     = {205--227},
  publisher = {Springer},
  year      = {2020},
  url       = {https://doi.org/10.1007/978-3-030-65277-7\_9},
  doi       = {10.1007/978-3-030-65277-7\_9},
  timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/indocrypt/AzouaouiDPSPV20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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