On the Worst-Case Side-Channel Security of ECC Point Randomization in Embedded Devices. Azouaoui, M., Durvaux, F., Poussier, R., Standaert, F., Papagiannopoulos, K., & Verneuil, V. In Bhargavan, K., Oswald, E., & Prabhakaran, M., editors, Progress in Cryptology - INDOCRYPT 2020 - 21st International Conference on Cryptology in India, Bangalore, India, December 13-16, 2020, Proceedings, volume 12578, of Lecture Notes in Computer Science, pages 205–227, 2020. Springer.
Paper doi bibtex @inproceedings{DBLP:conf/indocrypt/AzouaouiDPSPV20,
author = {Melissa Azouaoui and
Fran{\c{c}}ois Durvaux and
Romain Poussier and
Fran{\c{c}}ois{-}Xavier Standaert and
Kostas Papagiannopoulos and
Vincent Verneuil},
editor = {Karthikeyan Bhargavan and
Elisabeth Oswald and
Manoj Prabhakaran},
title = {On the Worst-Case Side-Channel Security of {ECC} Point Randomization
in Embedded Devices},
booktitle = {Progress in Cryptology - {INDOCRYPT} 2020 - 21st International Conference
on Cryptology in India, Bangalore, India, December 13-16, 2020, Proceedings},
series = {Lecture Notes in Computer Science},
volume = {12578},
pages = {205--227},
publisher = {Springer},
year = {2020},
url = {https://doi.org/10.1007/978-3-030-65277-7\_9},
doi = {10.1007/978-3-030-65277-7\_9},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/indocrypt/AzouaouiDPSPV20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}