On the Worst-Case Side-Channel Security of ECC Point Randomization in Embedded Devices. Azouaoui, M., Durvaux, F., Poussier, R., Standaert, F., Papagiannopoulos, K., & Verneuil, V. IACR Cryptol. ePrint Arch., 2020.
On the Worst-Case Side-Channel Security of ECC Point Randomization in Embedded Devices [link]Paper  bibtex   
@article{DBLP:journals/iacr/AzouaouiDPSPV20,
  author    = {Melissa Azouaoui and
               Fran{\c{c}}ois Durvaux and
               Romain Poussier and
               Fran{\c{c}}ois{-}Xavier Standaert and
               Kostas Papagiannopoulos and
               Vincent Verneuil},
  title     = {On the Worst-Case Side-Channel Security of {ECC} Point Randomization
               in Embedded Devices},
  journal   = {{IACR} Cryptol. ePrint Arch.},
  pages     = {1368},
  year      = {2020},
  url       = {https://eprint.iacr.org/2020/1368},
  timestamp = {Wed, 02 Dec 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/iacr/AzouaouiDPSPV20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

Downloads: 0