Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing. Badereddine, N., Girard, P., Pravossoudovitch, S., Landrault, C., Virazel, A., & Wunderlich, H. In Proceedings of VLSI-SoC, pages 403-408, 2006. Paper bibtex @inproceedings{ dblp3384618,
title = {Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing},
author = {Nabil Badereddine and Patrick Girard and Serge Pravossoudovitch and Christian Landrault and Arnaud Virazel and Hans-Joachim Wunderlich},
author_short = {Badereddine, N. and Girard, P. and Pravossoudovitch, S. and Landrault, C. and Virazel, A. and Wunderlich, H.},
bibtype = {inproceedings},
type = {inproceedings},
year = {2006},
key = {dblp3384618},
id = {dblp3384618},
biburl = {http://www.dblp.org/rec/bibtex/conf/vlsi/BadereddineGPLVW06},
url = {http://dx.doi.org/10.1109/VLSISOC.2006.313222},
conference = {VLSI-SoC},
pages = {403-408},
text = {VLSI-SoC 2006:403-408},
booktitle = {Proceedings of VLSI-SoC}
}
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